Results 101 to 110 of about 8,394,012 (247)
An integrated transfer learning framework integrates CALPHAD simulations, diffusion‐multiple experiments, and literature data to predict long‐term microstructural stability and short‐term mechanical properties of Ni‐based powder metallurgy superalloys. Based on these model predictions, a high‐performance, low‐density alloy, USTB‐PM750, is designed from
Zixin Li +8 more
wiley +1 more source
In this paper, we investigate the evolution of hydrogen (H) behavior in back-gated IGZO/HfO2 transistors subjected to low-temperature annealing (200 °C in air), focusing on its impact on initial electrical characteristics (Id-Vg) and ...
Liang Xiang +10 more
doaj +1 more source
A Two-Stage Model for Negative Bias Temperature Instability,” in
-Negative bias temperature instability is regarded as one of the most important reliability concerns of highly scaled PMOS transistors. As a consequence of the continuous downscaling of semiconductor devices this issue has become even more important over
Siegfried Selberherr, Tibor Grasser
core
Statistical Study of Bias Temperature Instabilities by Means of 3D 'Atomistic' Simulation
This chapter presents a comprehensive simulation study of the reliability performance in contemporary bulk MOSFET devices. With the CMOS technology entering in the nanoscale era, the statistical variability due to random dopant fluctuations plays a ...
Amoroso, SM +9 more
core +1 more source
Ferroelectric Devices for In‐Memory and In‐Sensor Computing
Inspired by biological systems, in‐memory and in‐sensor computing overcome von Neumann bottlenecks. Ferroelectric devices can mimic synaptic functions and sense stimuli like light or force, therefore are ideal for these paradigms. This review introduces the ferroelectric devices applied for in‐memory and in‐sensor computing, covering their structures ...
Hong Fang +5 more
wiley +1 more source
This work reports on epitaxially grown Hf0.52Zr0.48O2 ferroelectric memristors with high stability (high durability exceeding 108 cycles and a retention time exceeding 104 s for 16 states) and ultra‐low operating energy consumption (∼121 fJ). A memristor array‐based reservoir computing system is constructed and applied for the first time in the field ...
Ying Liu +6 more
wiley +1 more source
Modeling of negative bias temperature instability, Journal of Telecommunications and Information Technology, 2007, nr 2 [PDF]
Negative bias temperature instability is regarded as one of the most important reliability concerns of highly scaled PMOS transistors. As a consequence of the continuous downscaling of semiconductor devices this issue has become even more important over ...
Grasser, Tibor, Selberherr, Siegfried
core +1 more source
Negative Bias Temperature Instability Analysis of Multi-Bridged-Channel CFETs [PDF]
Complementary Field-Effect Transistors (CFETs) are among the most promising candidates for next-generation technology nodes due to their potential for aggressive footprint scaling, improved density, and reduced parasitics through vertical integration ...
Thoti, Narasimhulu, Komsa, Hannu-Pekka
core +1 more source
Flexoelectricity in Photoconversion: Fundamentals, Materials, and Outlooks
Mechanical bending of a flexible cantilever induces a strain gradient in the photoactive material. The resulting flexoelectric field couples with photovoltaic and photoconductive effects, modulating charge generation, separation, and collection. A comparative analysis of oxide perovskites, halide perovskites, and two‐dimensional materials is presented,
Xiang Huang, Feng Li, Rongkun Zheng
wiley +1 more source
Real-Time Monitoring Method and Circuit Based on Built-In Reliability Prediction
The failure of different chips under working conditions is influenced by various stress states such as different voltages, temperatures, stress durations, and stress variations.
Wenke Ren +5 more
doaj +1 more source

