Results 181 to 189 of about 8,396,680 (189)

Mechanism of Threshold Voltage Shift (ΔVth) Caused by Negative Bias Temperature Instability (NBTI) in Deep Sub-Micron pMOSFETs

Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 2001
Chuan H. Liu, Ming T. Lee, Chih-Yung Lin, Jenkon Chen, Klaus Schruefer, Thomas Schiml, Anastasios A. Katsetos, Zhijian Yang, Nivo Rovedo, Terence B. Hook, Clement Wann   +10 more
openaire   +1 more source

New Insight Into Negative Bias Temperature Instability Degradation During Self-Heating in Nanoscale Bulk FinFETs

IEEE Electron Device Letters, 2019
Dokyun Son, Kyushik Hong, Hyungcheol Shin   +2 more
exaly  

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Electronic Materials Letters, 2013
Ga-Won Lee, Hideok Lee, Sang-Youl Lee
exaly  

Evidence That Two Tightly Coupled Mechanisms Are Responsible for Negative Bias Temperature Instability in Oxynitride MOSFETs

IEEE Transactions on Electron Devices, 2009
Tibor Grässer, Ben Kaczer
exaly  

Analysis of Enhanced Degradation Under Dynamic Negative Bias Temperature Instability (NBTI) Condition in Low-Temperature Polycrystalline Silicon Thin-Film Transistors (LTPS TFTs)

IEEE Transactions on Electron Devices
Tsung-Ming Tsai, Yong-Ci Zhang, Hong-Yi Tu   +2 more
exaly  

Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effect

2010
CHUANG CHING-TE K, KIM JAE-JOON, KIM TAE-HYOUNG, LU PONG-FEI, MUKHOPADHYAY SAIBAL, RAO RAHUL M, WANG SHAO-YI   +6 more
openaire   +1 more source

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification

2024 IEEE International Reliability Physics Symposium (IRPS)
Da Wang, Yongkang Xue, Yong Liu 0035, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang 0001   +14 more
openaire   +2 more sources

System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)

2004
ABADEER WAGDI WILLIAM, ELLIS WAYNE FREDERICK, HANSEN PATRICK R, MCKENNA JONATHAN M   +3 more
openaire   +1 more source

Negative bias temperature instability (NBTI) of bulk FinFETs

Jong-Ho Lee, Tai-Su Park, Donggun Park   +2 more
exaly