Results 111 to 120 of about 1,541,139 (220)

Time of Flight Secondary Ion Mass Spectrometry for Characterization of Pt-Coated Porous Transport Layers in PEM Water Electrolyzers. [PDF]

open access: yesACS Appl Nano Mater
Stelmacovich G   +9 more
europepmc   +1 more source

Structural properties of transparent Ti-V oxide semiconductor thin films

open access: yesOpen Physics, 2013
Sieradzka Karolina   +5 more
doaj   +1 more source

The effect of ruthenium oxidation on the decomposition of SiH<sub>4</sub>.

open access: yesPhys Chem Chem Phys
Perez-Penco E   +3 more
europepmc   +1 more source

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