Results 281 to 290 of about 21,020,521 (317)
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physica status solidi (RRL) – Rapid Research Letters, 2023
In this article, a method of nitrogen plasma treatment is proposed to achieve normally off p‐GaN/AlGaN/GaN high‐electron‐mobility transistors, and the related mechanism is proposed. A nitrogen plasma treatment is employed to deplete holes in the p‐GaN layer to change the surface characteristics.
Shaoqian Lu +12 more
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In this article, a method of nitrogen plasma treatment is proposed to achieve normally off p‐GaN/AlGaN/GaN high‐electron‐mobility transistors, and the related mechanism is proposed. A nitrogen plasma treatment is employed to deplete holes in the p‐GaN layer to change the surface characteristics.
Shaoqian Lu +12 more
openaire +1 more source
, 2020
Transition metal dichalcogenides (TMDs) have gained extensive interest due to their phenomenal optoelectrical and electrochemical properties. Recently, TMDs are used as one of the auspicious materials for the chemical gas sensor application owing to ...
M. Reddeppa +7 more
semanticscholar +1 more source
Transition metal dichalcogenides (TMDs) have gained extensive interest due to their phenomenal optoelectrical and electrochemical properties. Recently, TMDs are used as one of the auspicious materials for the chemical gas sensor application owing to ...
M. Reddeppa +7 more
semanticscholar +1 more source
OFF-State Drain-Voltage-Stress-Induced VTH Instability in Schottky-Type p-GaN Gate HEMTs
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2020In this article, we systematically investigate the OFF-state drain-voltage-stress-induced threshold voltage ( $V_{\mathrm {TH}}$ ) instability in Schottky-type p-GaN gate high electron mobility transistors (HEMTs).
Junting Chen +6 more
semanticscholar +1 more source
p-GaN Gate HEMT With Surface Reinforcement for Enhanced Gate Reliability
, 2020By deploying a surface reinforcement layer (SRL) at the interface between Schottky metal and p-GaN in the gate stack, a p-GaN gate high-electron-mobility transistor (HEMT) with enhanced gate reliability is demonstrated. Prior to the gate metal deposition,
Li Zhang +5 more
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3.3 kV Multi-Channel AlGaN/GaN Schottky Barrier Diodes With P-GaN Termination
IEEE Electron Device Letters, 2020This work demonstrates five-channel AlGaN/ GaN Schottky barrier diodes (SBDs) fabricated on a 4-inch wafer with a sheet resistance of $115~\Omega $ /sq. A novel edge termination based on regrown p-GaN is proposed to manage the electric field crowding in
M. Xiao +7 more
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Journal of Crystal Growth, 2017
Growth conditions are used to control the residual carbon impurity incorporation in p++-GaN layers. Specific contact resistance (ρc) with various residual carbon concentrations has been investigated through the circular transmission line model (CTLM) method and secondary ion mass spectroscopy (SIMS) analysis.
Feng Liang +14 more
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Growth conditions are used to control the residual carbon impurity incorporation in p++-GaN layers. Specific contact resistance (ρc) with various residual carbon concentrations has been investigated through the circular transmission line model (CTLM) method and secondary ion mass spectroscopy (SIMS) analysis.
Feng Liang +14 more
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A high performance self-powered ultraviolet photodetector based on a p-GaN/n-ZnMgO heterojunction
Journal of Materials Chemistry C, 2020A high performance p-GaN/n-ZnMgO heterojunction photodiode was demonstrated and investigated.
Yong‐Bao Zhu +8 more
semanticscholar +1 more source
ACS Applied Materials and Interfaces, 2020
Photoelectrochemical (PEC) water splitting has been considered as of the future technology to store solar-energy in the chemical-bonds. However, due to the search of ideal heterostructured materials for photoanode/cathode, the full potential of this ...
D. Ghosh, P. Devi, Praveen Kumar
semanticscholar +1 more source
Photoelectrochemical (PEC) water splitting has been considered as of the future technology to store solar-energy in the chemical-bonds. However, due to the search of ideal heterostructured materials for photoanode/cathode, the full potential of this ...
D. Ghosh, P. Devi, Praveen Kumar
semanticscholar +1 more source
E-mode p-GaN Gate HEMT with p-FET Bridge for Higher VTH and Enhanced VTH Stability
International Electron Devices Meeting, 2020a novel p-GaN gate topology is proposed to inherently increase threshold voltage (VTH) and enhance VTH stability. The gate consists of a conventional Schottky-type p-GaN gate and a normally-on p-channel FET bridge connecting source and gate.
M. Hua +10 more
semanticscholar +1 more source
Al contacts to nanoroughened p-GaN
Microelectronics Journal, 2009Nanoroughening of a p-GaN surface using nanoscale Ni islands as an etch mask was utilized to investigate the feasibility for the flip-chip configuration light-emitting diodes (LEDs) using an Al-based reflector. Improved ohmic characteristics were found for the nanoroughened sample.
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