Results 181 to 190 of about 868 (191)

PBTI Response to Interfacial Layer Thickness Variation in Hf-Based HKMG nFETs

2010
E Cartier
exaly  

Hot Carrier and PBTI Induced Degradation in Silicon Nanowire Gate-All-Around SONOS MOSFETs

Microelectronics Reliability, 2014
Jong Tae Park, Chong Gun Yu
exaly  

Advanced PBTI Reliability With 0.69 nm EOT GdHfO Gate Dielectric

Solid-State Electronics, 2011
Ben Kaczer, Christoph Adelmann, Guido Groeseneken   +2 more
exaly  

Process Dependence of AC/DC PBTI in HKMG n-MOSFETs

2014
F Guarin, G la Rosa
exaly  

Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-k Metal Gate Technologies

2011
Chris Kim, Saibal Mukhopadhyay, Aditya Bansal   +2 more
exaly  

Unveiling the Impact of AC PBTI on Hydrogen Formation in Oxide Semiconductor Transistors

2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Gan Liu, Qiwen Kong, Zuopu Zhou, X. Ying, Chen Sun 0010, Kaizhen Han, Yuye Kang, Dong Zhang, Xiaolin Wang 0007, Yang Feng, Wei Shi, Bich-Yen Nguyen, N. Kai, Gengchiau Liang, Xiao Gong   +14 more
openaire   +2 more sources

A Novel Transient Characterization Technique to Investigate Trap Properties in HfSiON Gate Dielectric MOSFETs-From Single Electron Emission to PBTI Recovery Transient

IEEE Transactions on Electron Devices, 2006
Tahui Wang, Chun-Jung Tang
exaly  

S. S. KUTATELADZE AND THE PBTI LABORATORY OF BOILER HYDRAULICS

International Journal of Fluid Mechanics Research, 2000
openaire   +1 more source

Early Detection and Prediction of HKMG SRAM HTOL Performance by WLR PBTI Tests

Microelectronics Reliability, 2016
exaly  

Advancing the Understanding of Reliability in BEOL-Compatible Oxide Semiconductor Transistors: The Impact of AC PBTI

IEEE Transactions on Electron Devices
Liu Gan
exaly