Results 31 to 40 of about 17,195 (246)
Physical model-based ArF photoresist formulation development
Since the logic 28 nm technology and beyond, ArF immersion lithography has been widely used in manufacturing. To fully utilize the potential of the lithographic resolution, process simulation has been used since the lithography process setup step.
Liwan Yue +4 more
doaj +1 more source
A Study on the Resolution and Depth of Focus of ArF Immersion Photolithography
In this study, the resolution and depth of focus (DOF) of the ArF immersion scanner are measured experimentally according to numerical aperture (NA).
Jungchul Song, Chae-Hwan Kim, Ga-Won Lee
doaj +1 more source
Three‐dimensional Antimony Sulfide Based Flat Optics
This work presents the development of a grayscale electron beam lithography (g‐EBL) method for fabricating antimony trisulfide (Sb2S3) nanostructures with customizable 3D profiles. The refractive index of g‐EBL patterned Sb2S3 is determined based on the synergy of genetic algorithm and transfer matrix method.
Wei Wang +18 more
wiley +1 more source
A poly(methyl methacrylate) (PMMA) substrate is easily soluble in acetone and cannot withstand high temperatures, thereby restricting the application of graphene or boron nitride (BN) on it.
Anjiang Cai +6 more
doaj +1 more source
In this study, HATCN is coated on flexible PET/indium tin oxide (ITO) substrate as a modified layer and a hole injection layer to improve the hole injection from ITO.
Fuh-Shyang Juang +3 more
doaj +1 more source
Spectrally Tunable 2D Material‐Based Infrared Photodetectors for Intelligent Optoelectronics
Intelligent optoelectronics through spectral engineering of 2D material‐based infrared photodetectors. Abstract The evolution of intelligent optoelectronic systems is driven by artificial intelligence (AI). However, their practical realization hinges on the ability to dynamically capture and process optical signals across a broad infrared (IR) spectrum.
Junheon Ha +18 more
wiley +1 more source
Reflective Absorption IR Fourier-Spectroscopy of Photoresistive Films on Silicon
A comparative analysis of the reflectance-absorption spectroscopy method’s application using the diffuse reflection factory prefix DRIFT of the ALPHA IR spectrophotometer and the method of attenuated total reflection for study of the optical ...
D. I. Brinkevich +5 more
doaj +1 more source
Study of optimization condition for spin coating of the photoresist film on rectangular substrate by Taguchi design of an experiment [PDF]
There are four parameters concerning the spin coating of a positive photoresist film. This paper focuses on spin coating of the positive photoresist Clariantz AZ-P4620 on a 2x7 cm rectangular substrate.
Nithi Atthi +5 more
doaj
Silver (Ag) nanowires have attracted significant attention as flexible electrodes for various wearable electronic devices owing to their excellent optical and electrical properties.
Byungil Hwang, Paolo Matteini
doaj +1 more source
Electron–Matter Interactions During Electron Beam Nanopatterning
This article reviews the electron–matter interactions important to nanopatterning with electron beam lithography (EBL). Electron–matter interactions, including secondary electron generation routes, polymer radiolysis, and electron beam induced charging, are discussed.
Camila Faccini de Lima +2 more
wiley +1 more source

