Results 91 to 93 of about 102 (93)

Positive bias temperature instability induced positive charge generation in P+ Poly/SiON pMOSFET's

2012
Vijay Reddy, Paul E Nicollian
exaly  

Trap Behaviors and Degradation Modeling in Positive Bias Temperature Instability of Back Gated IGZO Transistors

Guilei Wang
exaly  

Improved positive bias temperature instability of n-type vertical C-shaped-channel nanosheet FET by forming gas annealing

Microelectronic Engineering
exaly