Results 81 to 90 of about 102 (93)

As-grown-Generation Model for Positive Bias Temperature Instability

IEEE Transactions on Electron Devices, 2018
Rui Gao, Zhigang Ji, Weidong Zhang
exaly  

Significant reduction of Positive Bias Temperature Instability in high-k/metal-gate nFETs by incorporation of rare earth metals

Microelectronic Engineering, 2009
Ben Kaczer, Guido Groeseneken, M Aoulaiche   +2 more
exaly  

Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics

Microelectronic Engineering, 2005
Giuseppe Cocorullo, Felice Crupi, Calogero Pace   +2 more
exaly  

Voltage dependent degradation of HfSiON/SiO nMOSFETs under positive bias temperature instability

Microelectronics Reliability, 2014
Bongkoo Kang, Cheolgyu Kim
exaly  

Monitoring negative bias temperature instability (NBTI) and/or positive bias temperature instability (PBTI)

2013
KIM JAE-JOON, RAO RAHUL M
openaire   +1 more source

Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells

The Integration VLSI Journal, 2012
Antonio Gonzalez, José Antonio Rubio Sola, Ramon Canal Corretger   +2 more
exaly  

Mechanism of positive-bias temperature instability in sub-1-nm TaN/HfN/HfO/sub 2/ gate stack with low preexisting traps

IEEE Electron Device Letters, 2005
R Q Han, J F Kang, H Y Yu
exaly  

Positive bias temperature instability effects of Hf-based nMOSFETs with various nitrogen and silicon profiles

IEEE Electron Device Letters, 2005
Changhwan Choi, Chang Yong Kang, Manhong Zhang   +2 more
exaly  

Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effect

2010
CHUANG CHING-TE K, KIM JAE-JOON, KIM TAE-HYOUNG, LU PONG-FEI, MUKHOPADHYAY SAIBAL, RAO RAHUL M, WANG SHAO-YI   +6 more
openaire   +1 more source

Positive bias temperature instability in MOSFETs

IEEE Transactions on Electron Devices, 1998
W Eccleston, J F Zhang
exaly