Results 91 to 100 of about 250,697 (304)

Transistor step stress testing program, JANTX 2N2905A [PDF]

open access: yes
The effect of power and temperature stresses when applied to a variety of semiconductor devices is ...

core   +1 more source

Hermetic-coaxial package design for microwave transistors [PDF]

open access: yes, 1973
Semiconductor package has been developed for high power semiconductor devices that operate in the GHz-frequency range at several watts. Package includes stud, insulating ring, electrically conductive washer, insulating washer, braze ring, and cap.
Jacobson, D. S.
core   +1 more source

Reliability of Reverse Properties of Power Semiconductor Devices: Influence of Surface Dielectric Layer and its Experimental Verification [PDF]

open access: yes, 2008
Reliability of reverse properties of power semiconductor devices is an important condition for their practical application. Usual standard tests do not reveal total information concerning the technological genetic aspects of devices production.
Kojecký, B.   +2 more
core   +1 more source

Intermediate Resistive State in Wafer‐Scale Vertical MoS2 Memristors Through Lateral Silver Filament Growth for Artificial Synapse Applications

open access: yesAdvanced Functional Materials, EarlyView.
In MOCVD MoS2 memristors, a current compliance‐regulated Ag filament mechanism is revealed. The filament ruptures spontaneously during volatile switching, while subsequent growth proceeds vertically through the MoS2 layers and then laterally along the van der Waals gaps during nonvolatile switching.
Yuan Fa   +19 more
wiley   +1 more source

Identification of Gate Turn-Off Thyristor Switching Patterns Using Acoustic Emission Sensors

open access: yesSensors, 2020
Modern seagoing ships are often equipped with converters which utilize semiconductor power electronics devices like thyristors or power transistors. Most of them are used in driving applications such as powerful main propulsion plants, auxiliary podded ...
Maciej Kozak   +2 more
doaj   +1 more source

Edge Couplers with relaxed Alignment Tolerance for Pick-and-Place Hybrid Integration of III-V Lasers with SOI Waveguides

open access: yes, 2013
We report on two edge-coupling and power splitting devices for hybrid integration of III-V lasers with sub-micrometric silicon-on-insulator (SOI) waveguides. The proposed devices relax the horizontal alignment tolerances required to achieve high coupling
Marzban, Bahareh   +4 more
core   +1 more source

Bio‐Inspired Molecular Events in Poly(Ionic Liquids)

open access: yesAdvanced Functional Materials, EarlyView.
Originating from dipolar and polar inter‐ and intra‐chain interactions of the building blocks, the topologies and morphologies of poly(ionic liquids) (PIL) govern their nano‐ and micro‐processibility. Modulating the interactions of cation‐anion pairs with aliphatic dipolar components enables the tunability of properties, facilitated by “bottom‐up ...
Jiahui Liu, Marek W. Urban
wiley   +1 more source

General phase segregation and phase pinning effects in lanthanide-doped lead halide perovskite with dual-wavelength lasing

open access: yesNature Communications
A strategy of lanthanide-ion doping into dual-halogen-alloyed perovskites CsPb(X x Y1-x )3 (X, Y = Cl, Br, I) via chemical vapor deposition is introduced, obtaining a series of high-quality, stable microplates.
Junyu He   +18 more
doaj   +1 more source

High temperature electronics applications in space exploration [PDF]

open access: yes
The extension of the range of operating temperatures of electronic components and systems for planetary exploration is examined. In particular, missions which utilize balloon-borne instruments to study the Venusian and Jovian atmospheres are discussed ...
Jurgens, R. F.
core   +1 more source

Investigation of Fault-Tolerant Capabilities in an Advanced Three-Level Active T-Type Converter [PDF]

open access: yes, 2019
A novel fault-tolerant three-level power converter topology, named advanced three-level active T-Type (A3L-ATT) converter, is introduced to increase the reliability of multilevel power converters used in safety-critical applications.
He, Jiangbiao   +2 more
core   +1 more source

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