Results 241 to 250 of about 29,206 (304)
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Journal of Geophysical Research, 1970
This paper is a functional description of the ARL laser profilometer, a special-purpose laser device built to measure ocean-wave profiles from an airborne platform. Mounted in an aircraft flying at 60 meters above the surface and at 240 km/hr, the profilometer yields data which are processed to produce a vertical-section trace of the ocean surface ...
Wiley S. Olsen, Robert M. Adams
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This paper is a functional description of the ARL laser profilometer, a special-purpose laser device built to measure ocean-wave profiles from an airborne platform. Mounted in an aircraft flying at 60 meters above the surface and at 240 km/hr, the profilometer yields data which are processed to produce a vertical-section trace of the ocean surface ...
Wiley S. Olsen, Robert M. Adams
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Noncontact optical profilometer
Applied Optics, 1975The optical profilometer is a measuring instrument that utilizes a laser beam reflected from a surface to generate a profile of the reflecting surface. The device has been configured in such a manner as to allow stabilization of the measured profile with respect to laser intensity fluctuations and the reflectivity of the tested object. Measurements can
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Stitching swing arm profilometer test for large aperture aspherics
Chinese Optics Letters (COL), 2019We implemented a stitching swing arm profilometer (SSAP) test for the inner and outer regions of a large aspheric surface with a short arm. The SSAP was more capable of improving sampling density of surface and was less sensitive to system error, like ...
Ling Xiong +5 more
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Polarization-Shifting Profilometer
2005 Pacific Rim Conference on Lasers & Electro-Optics, 2006A high sensitive Michelson interferometer with polarization shifting approach is proposed to determine the surface profile of optical devices with real time capability. The depth resolution in nanometer range and the lateral resolution smaller than 3 micrometer is demonstrated experimentally.
null Hui-Kang Teng +2 more
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Holographic optical profilometer
SPIE Proceedings, 1991We present a novel non-contact holographic optical profilometer, which is light weight, compact and relatively simpler. Computer simulation results reveal that surface measurements with sub-micron resolution are possible both in the horizontal and vertical directions.
Erez Hasman +2 more
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Survey Review, 1996
Abstract Measurement of dimensions of inaccessible objects remains a challenge in spite of new technologies available. The authors of this article approached the problem with a photogrammetric method using a laser-camera combination installed in a helicopter. The method was applied to the topographic measurement of ice fields.
H. Haggrén +5 more
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Abstract Measurement of dimensions of inaccessible objects remains a challenge in spite of new technologies available. The authors of this article approached the problem with a photogrammetric method using a laser-camera combination installed in a helicopter. The method was applied to the topographic measurement of ice fields.
H. Haggrén +5 more
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Longitudinally dispersive profilometer
Pure and Applied Optics: Journal of the European Optical Society Part A, 1995A non-contacting optical profilometer is presented based on the principle of focus multiplexing by wavelength encoding due to a phase Fresnel lens. The decoding is performed by lateral dispersion. The surface profile is reconstructed after automatic point by point scanning with submicrometre height resolution.
H Perrin, P Sandoz, G Tribillon
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Laser interferential profilometer
SPIE Proceedings, 1992ABSTRACT The paper presents an optical scheme for precise focusing method. The beam reflected from the detail interferes with reference beam. Optimal parameters for optical scheme are calculated. It was found that optical scheme sensibility does not depend on focusing distance of the second objective. 1.
Vyacheslav B. Birman, V. Sedelnikov
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Three-beam interferometric profilometer
Applied Optics, 1983A noncontact optical technique for the measurement of thin-film thickness and surface roughness with 25-A and 2-μm vertical and horizontal resolutions, respectively, has been described. It is based on a common-path three-beam shearing interferometer, in which the outer beams act as a reference while the middle beam scans the surface.
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3-Dimensional Profile Distortion Measured by Stylus Type Surface Profilometer
Measurement: Journal of the International Measurement Confederation, 2013Dong-Hyeok Lee
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