Results 51 to 60 of about 1,387 (173)

Wavefront sensing at a high‐repetition‐rate X‐ray free‐electron laser

Journal of Synchrotron Radiation, EarlyView.
We demonstrate a fast, robust and sensor‐free approach to X‐ray speckle tracking that enables shot‐to‐shot wavefront characterization at high‐repetition‐rate X‐ray free‐electron lasers. Our measurements reveal a hierarchy of wavefront fluctuations indicative of instabilities in the accelerator and beamline optics at the European XFEL.Wavefront ...
Trey Guest, Patrik Vagovič, Luigi Adriano, Johan Bielecki, Sarlota Birnsteinova, Rita Graceffa, Jayanath Koliyadu, Kaye Morgan, Hiiro Moriyama, Daniel Mosko, Grant van Riessen, Kristian Sabol, Tokushi Sato, Peter Szeles, Zane Taylor, Jozef Uličný, Richard Bean, Adrian P. Mancuso, Brian Abbey   +18 more
wiley   +1 more source

PtychoX: differentiable ptychographic operators powered by CUDA

JPhys Photonics
Ptychography and related computational imaging techniques are widely used for quantitative phase reconstruction in optical and photonic systems.
Shuhe Zhang, Liangcai Cao
doaj   +1 more source

First X-ray spectral ptychography and resonant ptychographic computed tomography experiments at the SWING beamline from Synchrotron SOLEIL

Journal of Synchrotron Radiation
X-ray ptychography and ptychographic computed tomography have seen a rapid rise since the advent of fourth-generation synchrotrons with a high degree of coherent radiation.
Anico Kulow, Javier Pérez, Redhouane Boudjehem, Eric Gautier, Sébastien Pairis, Samy Ould-Chikh, Jean-Louis Hazemann, Julio César da Silva   +7 more
doaj   +1 more source

A beam‐direction cross‐vessel metrology method and error analysis for the ptychography setup at HEPS ID09

Journal of Synchrotron Radiation, EarlyView.
A beamline‐direction cross‐vessel metrology method and error analysis for ptychography setup at HEPS ID09 is proposed and implemented. A 12.3 nm reconstruction resolution of ptychography demonstrates the validity of metrology.A metrology method dedicated to position monitoring and correction for the ptychography setup at the High Energy Photon Source ...
Ruiying Liao, Zina Ou, Haihan Yu, Xuan Wang, Jie Dong, Aiyu Zhou, Wenkai Kang, Liang Zhou, Shanzhi Tang, Ming Li, Weifan Sheng   +10 more
wiley   +1 more source

XAFS measurement system using undulator synchronized on‐the‐fly monochromator scan at SPring‐8 BL36XU

Journal of Synchrotron Radiation, EarlyView.
Nonlinear scanning of a compact channel‐cut monochromator synchronized with an undulator‐gap movement system enables fast high‐flux X‐ray absorption fine structure measurements.In X‐ray absorption fine structure (XAFS) measurements at undulator beamlines, it has been difficult to simultaneously achieve both spectral time resolution and high X‐ray flux ...
Nozomu Ishiguro, Tomoya Uruga, Takuma Kaneko, Takashi Tanaka, Yasumasa Joti, Koji Motomura, Hiroshi Yamazaki, Yasunori Senba, Haruhiko Ohashi, Makina Yabashi, Yukio Takahashi   +10 more
wiley   +1 more source

X‐Ray Multibeam Ptychography at up to 20 keV: Nano‐Lithography Enhances X‐Ray Nano‐Imaging

Advanced Science
Hard X‐rays are needed for non‐destructive nano‐imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest‐quality images with single‐digit nm resolution using advanced techniques such as X‐ray ptychography.
Tang Li, Maik Kahnt, Thomas L. Sheppard, Runqing Yang, Ken V. Falch, Roman Zvagelsky, Pablo Villanueva‐Perez, Martin Wegener, Mikhail Lyubomirskiy   +8 more
doaj   +1 more source

Continuous-Wave THz Imaging for Biomedical Samples

Applied Sciences, 2020
In the past few decades, the applications of terahertz (THz) spectroscopy and imaging technology have seen significant developments in the fields of biology, medical diagnosis, food safety, and nondestructive testing.
Yaya Zhang, Chuting Wang, Bingxin Huai, Shiyu Wang, Yating Zhang, Dayong Wang, Lu Rong, Yongchang Zheng   +7 more
doaj   +1 more source

A Bayesian approach to spectroscopic depth sectioning for locating dopant atoms

Journal of Microscopy, EarlyView.
Abstract Locating dopants in 3D is of great interest as advanced materials and devices increasingly rely on control at atomic dimensions, and microscopy tools are constantly in development for this purpose. One potential tool is electron energy loss spectroscopy (EELS) depth sectioning, where a core‐loss signal is collected as a function of electron ...
Michael Deimetry, Timothy C. Petersen, Matthew Weyland, Scott D. Findlay   +3 more
wiley   +1 more source

Characterization of near-field ptychography

Optics Express, 2015
Near-field X-ray ptychography has recently been proposed and shown to be able to retrieve a sample's complex-valued transmission function from multiple near-field diffraction images each with a lateral shift of the sample and with a structured (by a diffuser) illumination [Stockmar et al. Sci Rep. 3 (2013)].
Richard M, Clare, Marco, Stockmar, Martin, Dierolf, Irene, Zanette, Franz, Pfeiffer   +4 more
openaire   +2 more sources

Hardware‐Attentive Programmable Fourier Ptychography Enables Task‐Adaptive Label‐Free Virtual Staining

Advanced Science, Volume 13, Issue 46, 17 August 2026.
Task‐adaptive programmable optics enables label‐free virtual staining through optical‐attention‐guided acquisition and reconstruction. By optimizing wavelength, illumination angle, exposure time, and imaging depth, the framework learns task‐relevant optical measurements, generating clinically interpretable virtual stains with improved fidelity, non ...
Tianyue He, Wenyi Jing, Le Zhang, Qican Zhang, Tingdong Kou, Xin He, Yan Qiu, Yang Lu, Jian Cui, Yongfu Wen, Zhenrong Zheng, Hongying Zhang, Dayong Jin, Junfei Shen   +13 more
wiley   +1 more source