Results 71 to 80 of about 1,452 (172)
Uncertainty-aware Fourier ptychography
Abstract Fourier ptychography (FP) offers both wide field-of-view and high-resolution holographic imaging, making it valuable for applications ranging from microscopy and X-ray imaging to remote sensing. However, its practical implementation remains challenging due to the requirement for precise numerical forward models that ...
Ni Chen +5 more
openaire +2 more sources
Electron ptychography, recognized as an ideal technique for low-dose imaging, consistently achieves deep sub-angstrom resolution at electron doses of several thousand electrons per square angstrom (e−/Å2) or higher.
Guanxing Li +12 more
doaj +1 more source
FPGA‐based scanner and SerialEM server for 4D‐STEM electron tomography
Software for a multipurpose hardware board enables flexible scanning with a ready acquisition and processing pipeline to implement 4D‐STEM electron tomography.Four‐dimensional scanning transmission electron microscopy (4D‐STEM) enables the acquisition of diffraction patterns at every probe position in a dense array.
Shahar Seifer, Michael Elbaum
wiley +1 more source
Flexoelectrically Induced Polar Topology in Twisted SrTiO3 Membranes
Twisted SrTiO3 bilayers host polar vortices of flexoelectric origin, revealed through combined experiment and theory. By reconstructing polarization from the toroidal moment of strain gradients, the work establishes a 3D chiral state with broken inversion and mirror symmetries.
Isabel Tenreiro +13 more
wiley +1 more source
ProSPyX: software for post-processing images of X-ray ptychography with spectral capabilities
X-ray ptychography is a coherent diffraction imaging technique based on acquiring multiple diffraction patterns obtained through the illumination of the sample at different partially overlapping probe positions.
Redhouane Boudjehem +7 more
doaj +1 more source
Imaging Correlography Using Ptychography
Imaging correlography, an effective method for long-distance imaging, recovers an object using only the knowledge of the Fourier modulus, without needing phase information. It is not sensitive to atmospheric turbulence or optical imperfections.
Zhixin Li +6 more
doaj +1 more source
This review systematically summarizes two‐dimensional layered and nonlayered oxides, focusing on their synthesis, properties, and post‐Moore applications in transistors, gate dielectrics, optoelectronics, and ferroelectric/magnetic devices. It also discusses challenges including scalable growth and interface engineering, along with future industrial ...
Xinjie Hou +5 more
wiley +1 more source
ABSTRACT Scanning transmission x‐ray microscopy (STXM) is a nanoscale imaging technique that can utilize several powerful contrast mechanisms for the quantitative mapping of chemical and physical materials properties. Spatial resolutions down to 7 nm at the soft x‐ray energy range have been demonstrated.
Simone Finizio +6 more
wiley +1 more source
Extreme ultraviolet (EUV) photomask inspection is a critical step in semiconductor manufacturing, requiring high-resolution, high-throughput solutions to detect nanometer-scale defects. Traditional actinic imaging systems relying on complex optics have a
Suman Saha +4 more
doaj +1 more source
Pushing the limits of electron ptychography
Subatomic probe sizes in convergent-beam electron microscopy offer new ...
Andrew R, Lupini +2 more
openaire +3 more sources

