Results 101 to 110 of about 1,437 (189)

Effects of Interface Oxidation on Noise Properties and Performance in III-V Vertical Nanowire Memristors. [PDF]

ACS Appl Mater Interfaces, 2023
Saketh Ram M, Svensson J, Wernersson LE.
europepmc   +1 more source

Local bifurcation with spin-transfer torque in superparamagnetic tunnel junctions. [PDF]

Nat Commun, 2022
Funatsu T, Kanai S, Ieda J, Fukami S, Ohno H.   +4 more
europepmc   +1 more source

Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs

npj 2D Materials and Applications
Evidence of microscopic inhomogeneities of the side source/drain contacts in 300 mm wafer integrated MoS2 field-effect transistors is presented. In particular, the presence of a limited number of low Schottky barrier spots through which channel carriers ...
Luca Panarella, Ben Kaczer, Quentin Smets, Stanislav Tyaginov, Pablo Saraza Canflanca, Andrea Vici, Devin Verreck, Tom Schram, Dennis Lin, Theresia Knobloch, Tibor Grasser, César Lockhart de la Rosa, Gouri S. Kar, Valeri Afanas’ev   +13 more
doaj   +1 more source

A RRAM-Based True Random Number Generator with 2T1R Architecture for Hardware Security Applications. [PDF]

Micromachines (Basel), 2023
Peng B, Wu Q, Wang Z, Yang J.
europepmc   +1 more source

Disentanglement Dynamics in Nonequilibrium Environments. [PDF]

Entropy (Basel), 2022
Chen M, Chen H, Han T, Cai X.
europepmc   +1 more source

Memory Effects in High-Dimensional Systems Faithfully Identified by Hilbert-Schmidt Speed-Based Witness. [PDF]

Entropy (Basel), 2022
Mahdavipour K, Khazaei Shadfar M, Rangani Jahromi H, Morandotti R, Lo Franco R.   +4 more
europepmc   +1 more source

Effect of high-pressure D₂ and H₂ annealing on LFN properties in FD-SOI pTFET. [PDF]

Sci Rep, 2022
Shin HJ, Eadi SB, An YJ, Ryu TG, Kim DW, Lee HD, Kwon HM.   +6 more
europepmc   +1 more source

Investigation of Program Efficiency Overshoot in 3D Vertical Channel NAND Flash with Randomly Distributed Traps. [PDF]

Nanomaterials (Basel), 2023
Park C, Yoon JS, Nam K, Jang H, Park M, Baek RH.   +5 more
europepmc   +1 more source

Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO₂ interface. [PDF]

Proc Natl Acad Sci U S A
Cowie M, Constantinou PC, Curson NJ, Stock TJZ, Grütter P.   +4 more
europepmc   +1 more source

Bi₂O₂Se-Based True Random Number Generator for Security Applications. [PDF]

ACS Nano, 2022
Liu B, Chang YF, Li J, Liu X, Wang LA, Verma D, Liang H, Zhu H, Zhao Y, Li LJ, Hou TH, Lai CS.   +11 more
europepmc   +1 more source