Work extraction from quantum coherence in non-equilibrium environment. [PDF]
Hadipour M, Haseli S.
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Oxide induced degradation in MoS<sub>2</sub> field-effect transistors. [PDF]
Ducry F +5 more
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Wordline Input Bias Scheme for Neural Network Implementation in 3D-NAND Flash. [PDF]
Hwang H, Kim G, Yu D, Kim H.
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Oxide Semiconductor for Advanced Memory Architectures: Atomic Layer Deposition, Key Requirement and Challenges. [PDF]
Lee CH +5 more
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Design of CMOS-memristor hybrid synapse and its application for noise-tolerant memristive spiking neural network. [PDF]
Lim JG +14 more
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Random telegraph noise (RTN) in scaled RRAM devices
2013 IEEE International Reliability Physics Symposium (IRPS), 2013The random telegraph noise (RTN) related read instability in resistive random access memory (RRAM) is evaluated by employing the RTN peak-to-peak (P-p) amplitude as a figure of merit (FoM). Variation of the FoM value over multiple set/reset cycles is found to follow the log-normal distribution.
D Veksler +2 more
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Too noisy at the nanoscale? — The rise of random telegraph noise (RTN) in devices and circuits
2016 IEEE International Nanoelectronics Conference (INEC), 2016This paper gives an outline of our recent findings on the random telegraph noise (RTN) in nanoscale MOS devices and circuits.
Runsheng Wang +2 more
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A simple method to identify metastable states in random telegraph noise (RTN)
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2017In this paper, a new and simple method named Weibull criterion is proposed to identify whether metastable states occur in single random telegraph noise (RTN), which has been verified by both simulation and experiment results. It is helpful for comprehensive understanding of trap properties and providing a direct evidence of oxide traps with multiple ...
Shaofeng Guo, Runsheng Wang
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Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs
2018 IEEE International Reliability Physics Symposium (IRPS), 2018In this paper, based on the complex random telegraph noise (RTN) data in FinFETs, the impacts of the trap coupling effect on RTN amplitude are studied statistically. The coupling effect is found to be enhanced by the double-side coupling mechanism in FinFETs.
Shaofeng Guo, Runsheng Wang
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