Results 101 to 110 of about 242 (144)

Oxide induced degradation in MoS<sub>2</sub> field-effect transistors. [PDF]

open access: yesNPJ 2D Mater Appl
Ducry F   +5 more
europepmc   +1 more source

Design of CMOS-memristor hybrid synapse and its application for noise-tolerant memristive spiking neural network. [PDF]

open access: yesFront Neurosci
Lim JG   +14 more
europepmc   +1 more source

Oxide induced degradation in MoS2 Field-Effect Transistors

open access: yes
Ducry F   +5 more
europepmc   +1 more source

Random telegraph noise (RTN) in scaled RRAM devices

2013 IEEE International Reliability Physics Symposium (IRPS), 2013
The random telegraph noise (RTN) related read instability in resistive random access memory (RRAM) is evaluated by employing the RTN peak-to-peak (P-p) amplitude as a figure of merit (FoM). Variation of the FoM value over multiple set/reset cycles is found to follow the log-normal distribution.
D Veksler   +2 more
exaly   +2 more sources

Too noisy at the nanoscale? — The rise of random telegraph noise (RTN) in devices and circuits

2016 IEEE International Nanoelectronics Conference (INEC), 2016
This paper gives an outline of our recent findings on the random telegraph noise (RTN) in nanoscale MOS devices and circuits.
Runsheng Wang   +2 more
exaly   +2 more sources

A simple method to identify metastable states in random telegraph noise (RTN)

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2017
In this paper, a new and simple method named Weibull criterion is proposed to identify whether metastable states occur in single random telegraph noise (RTN), which has been verified by both simulation and experiment results. It is helpful for comprehensive understanding of trap properties and providing a direct evidence of oxide traps with multiple ...
Shaofeng Guo, Runsheng Wang
exaly   +2 more sources

Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs

2018 IEEE International Reliability Physics Symposium (IRPS), 2018
In this paper, based on the complex random telegraph noise (RTN) data in FinFETs, the impacts of the trap coupling effect on RTN amplitude are studied statistically. The coupling effect is found to be enhanced by the double-side coupling mechanism in FinFETs.
Shaofeng Guo, Runsheng Wang
exaly   +2 more sources

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