Results 101 to 110 of about 2,532 (143)
Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors. [PDF]
ACS NanoHuang Z, Lee RG, Cuniberto E, Song J, Lee J, Alharbi A, Kisslinger K, Taniguchi T, Watanabe K, Kim YH, Shahrjerdi D. +10 moreeuropepmc +1 more sourceNoise suppression beyond the thermal limit with nanotransistor biosensors. [PDF]
Sci Rep, 2020 Kutovyi Y, Madrid I, Zadorozhnyi I, Boichuk N, Kim SH, Fujii T, Jalabert L, Offenhaeusser A, Vitusevich S, Clément N. +9 moreeuropepmc +1 more sourceInterferometric single-shot parity measurement in InAs-Al hybrid devices. [PDF]
NatureMicrosoft Azure Quantum, Aghaee M, Alcaraz Ramirez A, Alam Z, Ali R, Andrzejczuk M, Antipov A, Astafev M, Barzegar A, Bauer B, Becker J, Bhaskar UK, Bocharov A, Boddapati S, Bohn D, Bommer J, Bourdet L, Bousquet A, Boutin S, Casparis L, Chapman BJ, Chatoor S, Christensen AW, Chua C, Codd P, Cole W, Cooper P, Corsetti F, Cui A, Dalpasso P, Dehollain JP, de Lange G, de Moor M, Ekefjärd A, El Dandachi T, Estrada Saldaña JC, Fallahi S, Galletti L, Gardner G, Govender D, Griggio F, Grigoryan R, Grijalva S, Gronin S, Gukelberger J, Hamdast M, Hamze F, Hansen EB, Heedt S, Heidarnia Z, Herranz Zamorano J, Ho S, Holgaard L, Hornibrook J, Indrapiromkul J, Ingerslev H, Ivancevic L, Jensen T, Jhoja J, Jones J, Kalashnikov KV, Kallaher R, Kalra R, Karimi F, Karzig T, King E, Kloster ME, Knapp C, Kocon D, Koski JV, Kostamo P, Kumar M, Laeven T, Larsen T, Lee J, Lee K, Leum G, Li K, Lindemann T, Looij M, Love J, Lucas M, Lutchyn R, Madsen MH, Madulid N, Malmros A, Manfra M, Mantri D, Markussen SB, Martinez E, Mattila M, McNeil R, Mei AB, Mishmash RV, Mohandas G, Mollgaard C, Morgan T, Moussa G, Nayak C, Nielsen JH, Nielsen JM, Nielsen WHP, Nijholt B, Nystrom M, O'Farrell E, Ohki T, Otani K, Paquelet Wütz B, Pauka S, Petersson K, Petit L, Pikulin D, Prawiroatmodjo G, Preiss F, Puchol Morejon E, Rajpalke M, Ranta C, Rasmussen K, Razmadze D, Reentila O, Reilly DJ, Ren Y, Reneris K, Rouse R, Sadovskyy I, Sainiemi L, Sanlorenzo I, Schmidgall E, Sfiligoj C, Shah MB, Simoes K, Singh S, Sinha S, Soerensen T, Sohr P, Stankevic T, Stek L, Stuppard E, Suominen H, Suter J, Teicher S, Thiyagarajah N, Tholapi R, Thomas M, Toomey E, Tracy J, Turley M, Upadhyay S, Urban I, Van Hoogdalem K, Van Woerkom DJ, Viazmitinov DV, Vogel D, Watson J, Webster A, Weston J, Winkler GW, Xu D, Yang CK, Yucelen E, Zeisel R, Zheng G, Zilke J. +162 moreeuropepmc +1 more sourceRandom Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. [PDF]
Sensors (Basel), 2019 Chao CY, Yeh SF, Wu MH, Chou KY, Tu H, Lee CL, Yin C, Paillet P, Goiffon V. +8 moreeuropepmc +1 more sourceGround and In-Flight Calibration of the OSIRIS-REx Camera Suite. [PDF]
Space Sci Rev, 2020 Golish DR, Drouet d'Aubigny C, Rizk B, DellaGiustina DN, Smith PH, Becker K, Shultz N, Stone T, Barker MK, Mazarico E, Tatsumi E, Gaskell RW, Harrison L, Merrill C, Fellows C, Williams B, O'Dougherty S, Whiteley M, Hancock J, Clark BE, Hergenrother CW, Lauretta DS. +21 moreeuropepmc +1 more source