Results 1 to 10 of about 847 (149)

Investigation of random telegraph signal in two junction layouts of proton irradiated CMOS SPADs [PDF]

open access: yesScientific Reports, 2021
This paper focuses on the understanding of the Random Telegraph Signal (RTS) in Single-Photon Avalanche Diodes (SPAD). We studied the RTS of two different SPAD layouts, designed and implemented in a 150-nm CMOS process, after proton irradiation.
F. Di Capua   +5 more
doaj   +2 more sources

Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image Sensor [PDF]

open access: yesSensors, 2018
A probabilistic method to remove the random telegraph signal (RTS) noise and to increase the signal level is proposed, and was verified by simulation based on measured real sensor noise.
Haruki Ishida   +7 more
doaj   +2 more sources

A high-performance training-free pipeline for robust random telegraph signal characterization via adaptive wavelet-based denoising and Bayesian digitization methods [PDF]

open access: yesScientific Reports
Random telegraph signal (RTS) analysis is increasingly important for characterizing meaningful temporal fluctuations in physical, chemical, and biological systems.
Tonghe Bai, Ayush Kapoor, Na Young Kim
doaj   +2 more sources

Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor [PDF]

open access: yesSensors, 2023
In this work, the degradation of the random telegraph noise (RTN) and the threshold voltage (Vt) shift of an 8.3Mpixel stacked CMOS image sensor (CIS) under hot carrier injection (HCI) stress are investigated. We report for the first time the significant
Calvin Yi-Ping Chao   +6 more
doaj   +2 more sources

Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors

open access: yesResults in Physics, 2020
The dark current random telegraph signal (DC-RTS) has been investigated in a four-transistor pinned photodiode 0.18-μm backside illuminated CMOS image sensor (BSI CIS). The sensors were irradiated by high energy protons of 50, 60 and 70 MeV, respectively.
Bingkai Liu   +9 more
doaj   +3 more sources

Wide-Dynamic-Range Lead-Free SWIR Image Sensors Based on InAs Thin-Film Quantum-Dot Photodiodes [PDF]

open access: yesSensors
This work presents a monolithically integrated short-wavelength infrared (SWIR) image sensor based on indium arsenide (InAs) quantum dot photodiodes (QDPDs).
Myonglae Chu   +22 more
doaj   +2 more sources

Post-processing of real-time quantum event measurements for an optimal bandwidth [PDF]

open access: yesScientific Reports, 2023
Single electron tunneling and its transport statistics have been studied for some time using high precision charge detectors. However, this type of detection requires advanced lithography, optimized material systems and low temperatures (mK). A promising
J. Kerski   +9 more
doaj   +2 more sources

Effects of Hot Pixels on Pixel Performance on Backside Illuminated Complementary Metal Oxide Semiconductor (CMOS) Image Sensors

open access: yesSensors, 2023
Effects of hot pixels on pixel performance in light and dark environments have been investigated in pinned photodiode 0.18 μm backside illuminated CMOS image sensors irradiated by 10 MeV protons.
Bingkai Liu   +4 more
doaj   +1 more source

Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process

open access: yesIEEE Journal of the Electron Devices Society, 2021
It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used a charge integration method similar to the operation of the CMOS image sensors (CIS) to ...
Calvin Yi-Ping Chao   +7 more
doaj   +1 more source

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