Results 11 to 20 of about 946 (248)

Random telegraph signals in molecular junctions

open access: yesJournal of Physics: Condensed Matter, 2014
We investigate conductance fluctuations in molecular junctions using a mechanically controllable break junction setup in a liquid environment. In contrast to conventional break junction measurements, time-dependent conductance signals were recorded while reducing the gap size between the two contact electrodes.
Brunner, Jan   +3 more
openaire   +7 more sources

Theory of slow traps and random telegraph signals in ultra-small planar MOSFETs

open access: yesAIP Advances, 2023
It is shown that ultra-small MOSFETs with heavily doped substrates contain a significant concentration of slow traps in their space-charge regions. Such a trap arises due to random doping fluctuations and is created if a few shallow impurities form a ...
B. I. Fuks
doaj   +1 more source

Random telegraph signal analysis with a recurrent neural network [PDF]

open access: yesPhysical Review E, 2020
We use an artificial neural network to analyze asymmetric noisy random telegraph signals (RTSs), and extract underlying transition rates. We demonstrate that a long short-term memory neural network can vastly outperform conventional methods, particularly for noisy signals. Our technique gives reliable results as the signal-to-noise ratio approaches one,
N. J. Lambert   +4 more
openaire   +3 more sources

Multilevel RTN Removal Tools for Dynamic FBG Strain Measurements Corrupted by Peak-Splitting Artefacts

open access: yesSensors, 2021
Strain measurements using fibre Bragg grating (FBG) optical sensors are becoming ever more commonplace. However, in some cases, these measurements can become corrupted by sudden jumps in the signal, which manifest as spikes or step-like offsets in the ...
Dominik Johannes Marius Fallais   +4 more
doaj   +1 more source

Characterization of dark current signal measurements of the ACCDs used on board the Aeolus satellite [PDF]

open access: yesAtmospheric Measurement Techniques, 2021
Even just shortly after the successful launch of the European Space Agency satellite Aeolus in August 2018, it turned out that dark current signal anomalies of single pixels (so-called “hot pixels”) on the accumulation charge-coupled devices (ACCDs) of ...
F. Weiler   +9 more
doaj   +1 more source

RTNinja: A generalized machine learning framework for analyzing random telegraph noise signals in nanoelectronic devices [PDF]

open access: yesAPL Machine Learning
Random telegraph noise is a prevalent variability phenomenon in nanoelectronic devices, arising from stochastic carrier exchange at defect sites and critically impacting device reliability and performance.
Anirudh Varanasi   +3 more
doaj   +1 more source

Detection and analysis of random telegraph signal noise in P-MOSFET

open access: yesDianzi Jishu Yingyong, 2018
Power metal oxide semiconductor FET(P-MOSFET)is the core device that forms the power communication power,its reliability directly affects the safe and stable operation of power communication. Random telegraph signal(RTS) noise is a sensitive parameter to
Fan Xinxin   +3 more
doaj   +1 more source

Microwave irradiation effects on random telegraph signal in a MOSFET [PDF]

open access: yesPhysics Letters A, 2007
3 pages, 4 ...
E. PRATI   +4 more
openaire   +6 more sources

Random Telegraph Signal Phenomena in Ultra Shallow p+n Silicon Avalanche Diodes

open access: yesIEEE Journal of the Electron Devices Society, 2018
An extensive time domain analysis of the random telegraph signal (RTS) phenomena in silicon avalanche diodes is presented. Experiments show two distinct types of RTSs classified herein, on the basis of the temporal behavior of the amplitude, as the ...
Vishal Agarwal   +5 more
doaj   +1 more source

RTN and Annealing Related to Stress and Temperature in FIND RRAM Array

open access: yesNanoscale Research Letters, 2019
In this work, an observation on random telegraph noise (RTN) signal in the read current of a FinFET dielectric RRAM (FIND RRAM) device is presented. The RTN signal of a FIND RRAM cell is found to change after the device being subjected to cycling stress.
Chih Yuan Chen   +2 more
doaj   +1 more source

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