Results 31 to 40 of about 2,718 (178)

Random telegraph signals in proton irradiated CCDs and APS [PDF]

open access: yes, 2008
Random telegraph dark signal fluctuations have been studied in two types of CCD and two types of CMOS active pixel sensor after proton irradiation at 1.5, 10 and 60 MeV.
Goiffon, Vincent   +2 more
core   +1 more source

The influence of a single defect in composite gate insulators on the performance of nanotube transistors

open access: yes, 2014
The current through a carbon nanotube field-effect transistor (CNFET) with cylindrical gate electrode is calculated using the nonequilibrium Greens function method in a tight-binding approximation.
Wang, Neng-Ping, Yu, Wen-Juan
core   +1 more source

No Effect of Continuous Transcutaneous Auricular Vagus Nerve Stimulation on the P3, the P600, or Physiological Markers of Noradrenergic Activity in an Oddball and Sentence Comprehension Task

open access: yesPsychophysiology, Volume 63, Issue 2, February 2026.
ABSTRACT The ERP components P3 and P600 have been proposed to reflect phasic activity of the locus coeruleus norepinephrine (LC/NE) system in response to deviant and task‐relevant stimuli across cognitive domains. However, causal evidence for this link remains limited. Here, we used continuous transcutaneous auricular vagus nerve stimulation (taVNS), a
Friederike Contier   +3 more
wiley   +1 more source

Design and Applications of Multi‐Frequency Programmable Metamaterials for Adaptive Stealth

open access: yesAdvanced Functional Materials, Volume 36, Issue 5, 15 January 2026.
This article provides a comprehensive overview of metamaterials, including their fundamental principles, properties, synthesis techniques, and applications in stealth, as well as their challenges and future prospects. It covers topics that are more advanced than those typically discussed in existing review articles, while still being closely connected ...
Jonathan Tersur Orasugh   +4 more
wiley   +1 more source

Low-frequency noise impact on CMOS image sensors [PDF]

open access: yes, 2009
CMOS image sensors are nowadays extensively used in imaging applications even for high-end applications. This is really possible thanks to a reduction of noise obtained, among others, by Correlated Double Sampling (CDS) readout.
Magnan, Pierre   +1 more
core  

A stochastic model of the influence of buffer gas collisions on Mollow spectra

open access: yes, 2013
In this paper we consider the influence of collisional fluctuations on the Mollow spectra of resonance fluorescence (RF). The fluctuations are taken into account by a simple shift of the constant detuning, involved in a set of optical Bloch equations by ...
Dinh, T. Bui   +3 more
core   +1 more source

RTS amplitudes in decananometer MOSFETs: 3-D simulation study [PDF]

open access: yes, 2003
In this paper we study the amplitudes of random telegraph signals (RTS) associated with the trapping of a single electron in defect states at the Si/SiO/sub 2/ interface of sub-100-nm (decananometer) MOSFETs employing three-dimensional (3-D) "atomistic ...
Asenov, A.   +3 more
core   +1 more source

Evidence of a novel source of random telegraph signal in CMOS image sensors [PDF]

open access: yes, 2011
This letter reports a new source of dark current random telegraph signal in CMOS image sensors due to meta-stable Shockley-Read-Hall generation mechanism at oxide interfaces.
Gaillardin, Marc   +4 more
core   +1 more source

Power Line Communication as a Sensor: Medium Voltage Cable Diagnostics

open access: yesIET Generation, Transmission &Distribution, Volume 20, Issue 1, January/December 2026.
This article investigates the use of broadband power line (BPL) communication as a diagnostic tool for medium‐voltage cables. Experimental results show that BPL modem parameters change in the presence of partial discharges, enabling real‐time monitoring of insulation health and supporting predictive maintenance.
Lukas Benesl   +6 more
wiley   +1 more source

Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes [PDF]

open access: yes, 2010
This paper presents a summary of the main results we observed after several years of study on irradiated custom imagers manufactured using 0,18 µm CMOS processes dedicated to imaging.
Cervantes, Paola   +6 more
core   +1 more source

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