Results 201 to 210 of about 28,999 (297)

Highly Sensitive Twin Resonance Coupling Refractive Index Sensor Based on Gold- and MgF2-Coated Nano Metal Films. [PDF]

open access: yesBiosensors (Basel), 2021
Ahmed K   +7 more
europepmc   +1 more source

Atomic Layer Deposition of Metallic Molybdenum Dioxide Thin Films Enabling High‐k Rutile Capacitors

open access: yesAdvanced Materials Interfaces, EarlyView.
The first direct atomic layer deposition (ALD) process of molybdenum dioxide (MoO2) thin films is reported using molybdenum(II) acetate dimer (Mo2(OAc)4) and oxygen (O2) as precursors at 235°C–275°C. The films are crystalline, exceptionally pure, and conductive.
Alexey Ganzhinov   +8 more
wiley   +1 more source

Tunable High-Sensitivity Four-Frequency Refractive Index Sensor Based on Graphene Metamaterial. [PDF]

open access: yesSensors (Basel)
Bao X   +9 more
europepmc   +1 more source

Simple Synthesis of Entropy Stabilized Oxides Single Crystal Films

open access: yesAdvanced Materials Interfaces, EarlyView.
Diffusion‐controlled enables the creation of a single‐crystal thin film of Entropy‐stabilized oxides (ESO). ABSTRACT Entropy‐stabilized oxides (ESO) have emerged in the last decade as a new class of metastable materials with promising functional properties.
Antoine Raison   +6 more
wiley   +1 more source

High‐Sensitivity Terahertz Gas Sensing Enabled by Undercut Metal‐Dielectric‐Metal Metamaterial

open access: yesAdvanced Materials Interfaces, EarlyView.
A terahertz (THz) metamaterial gas sensor is demonstrated using a metal–dielectric–metal (MDM) absorber with an undercut dielectric layer, which enlarges the gas‐replaced volume and strengthens refractive‐index perturbation of the resonant mode. A reflection dip at 0.766 THz is observed, and acetone–nitrogen tests yield concentration‐dependent shifts ...
Naoki Inomata   +2 more
wiley   +1 more source

Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging

open access: yesAdvanced Materials Interfaces, EarlyView.
This study establishes a dual‐channel optical metrology framework integrating phase‐shifting imaging ellipsometry and deep‐UV reflectance imaging. This label‐free approach enables simultaneous, time‐resolved mapping of film thickness and nanoparticle (NP) concentration in dynamic nanofluid thin films.
Eita Shoji   +3 more
wiley   +1 more source

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