Results 191 to 200 of about 290,108 (258)

Blood RNA Biomarker Signatures for Early Diagnosis and Prognosis in Ischemic and Hemorrhagic Stroke: The IBIS‐CT1 Study

open access: yesAnnals of Clinical and Translational Neurology, EarlyView.
ABSTRACT Objective To evaluate the expression of nine blood RNA biomarkers in a clinical trial based on genes previously identified in an experimental monkey model of stroke for diagnosis feasibility and prognostication. Methods IBIS‐CT1 was a prospective longitudinal study enrolling patients with ischemic stroke (IS) or intracerebral hemorrhage (ICH ...
Salomé Retailleau   +11 more
wiley   +1 more source

Psychometric properties and clinical utility of the EORTC QLQ-BM22 in patients with bone metastases: a systematic review. [PDF]

open access: yesEClinicalMedicine
Wisener N   +23 more
europepmc   +1 more source

Coping Engagement as the Pathway from Psychological Empowerment to Life Satisfaction: A Mediation and Moderation Independent Analyses Among Women in Northern Peru. [PDF]

open access: yesEur J Investig Health Psychol Educ
Vera-Calmet VG   +5 more
europepmc   +1 more source

Life Testing and Reliability Estimation

Technometrics, 1981
(1981). Life Testing and Reliability Estimation. Technometrics: Vol. 23, No. 3, pp. 310-311.
Albert H. Moore, S. K. Sinha, B. K. Kale
openaire   +2 more sources

Accelerated Life Testing and Experts' Opinion in Reliability.

Journal of the Royal Statistical Society. Series A (Statistics in Society), 1990
Introduction. Accelerated life testing and experts' opinion in reliability (D.V. Lindley). Experts' Opinions. Modern aspects of probability and utility (M.H. De Groot). The use of probability statements (D.V. Lindley). Choosing among experts (M.H. De Groot). A Bayesian view of weighted distributions and selection models (M.J. Bayarri and M.H. De Groot).
Francisco J. Samaniego   +2 more
openaire   +1 more source

Test fixture for MESFET reliability life tests

Microelectronics Reliability, 1987
Abstract DC tests may be the method on which to found an unitary methodology for setting and analysis of GaAs MESFET reliaiblity studies. Each failure mechanism must be stressed without introducing erroneous one, due to the artificial conditions of accelerated tests.
C. Canali   +4 more
openaire   +1 more source

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