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Bayes computation for life testing and reliability estimation
IEEE Transactions on Reliability, 1992Powerful computational techniques for estimating the parameters and the reliability function of complex life distributions, using Bayes methods, from complete and type-II censored samples are given. The Gibbs sampler approach brings considerable conceptual and computational simplicity to the calculation of the posterior marginals and reliability ...
Dey, Dipak K., Lee, Tai-Ming
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A proposal for contact life reliability test method
Electrical Contacts - 1996. Proceedings of the Forty-Second IEEE Holm Conference on Electrical Contacts. Joint with the 18th International Conference on Electrical Contacts, 2002Mentions several contact life measurement methods, and shows that the definition of life reliability is not clear. The author studied reliability concerning electrical contacts and electromechanical components. At this time, he shows studies concerning life and reliability test methods.
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Life Testing, Reliability, and Multivariate Nonparametric Methods
1979Abstract : Since the grant involves two distinct projects, this report is divided into two sections, number I dealing with the work of the principal investigator, and number II dealing with the co-investigator's research. Contents: I) Screening and Estimation Procedures for the Unknown Number of Defective Items in a Life Test, and Estimation of the ...
V. P. Bhapkar, Saul Blumenthal
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Reliability Life Testing Handbook
Technometrics, 1994Helmut Schneider, Dimitri Kececioglu
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Bayesian Approach to Life Testing and Reliability Estimation
Journal of the American Statistical Association, 1967Abstract Bayesian analysis of the exponential model, based on life tests that are terminated at preassigned time points or after preassigned number of failures, has been developed. For the prior distribution of the parameter involved, uniform, inverted gamma and exponential densities have been examined.
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Text fixture for MESFET reliability life tests
1987DC tests may be the method on which to found an unitary methodology for setting and analysis of GaAs MESFET reliability studies. Each failure mechanism must be stressed without introducing erroneous one, due to the artificial conditions of accelerated tests. A text fixture for these tests must enable the hgghest contro of aging conditions.
C. CANALI +4 more
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System reliability analysis using component-level and system-level accelerated life testing
Reliability Engineering and System Safety, 2021Zhen Hu +2 more
exaly
Recent Advances in Life Testing and Reliability
Technometrics, 1996Eric R. Ziegel, N. Balakrishnan
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