Results 191 to 200 of about 120,829 (333)
Exact and heuristic approaches for scheduling parallel stress test machines in semiconductor reliability laboratories [PDF]
Jessica Hautz +2 more
openalex +1 more source
A universal and nondestructive direct photolithography method enables high‐resolution quantum dot (QD) patterning without ligand exchange. By blending QDs with a photocrosslinkable polymer, this approach preserves the optical properties and enhances the QD‐LED efficiency and lifetime.
Jaeyeop Lee +15 more
wiley +1 more source
Advancing 2D CMOS electronics with high-performance p-type transistors. [PDF]
Jiang J +6 more
europepmc +1 more source
Impact of halo implant on the hot carrier reliability of germanium p-channel metal-oxide-semiconductor field-effect transitors [PDF]
J. Franco +5 more
openalex +1 more source
A spatiotemporal plasma–mediated laser processing approach is developed to fabricate ultrahigh–aspect ratio nanochannel arrays and corresponding perovskite nanowire arrays within transparent materials for optoelectronics devices. The laser‐fabricated nanochannels serve as templates for controlled perovskite infiltration and crystallization, enabling ...
Taijin Wang +3 more
wiley +1 more source
MCHB-DETR: An Efficient and Lightweight Inspection Framework for Ink Jet Printing Defects in Semiconductor Packaging. [PDF]
Chen Y, He J, Shi Z, Pan Y, Ou W.
europepmc +1 more source
Reliability prediction of semiconductor devices using modified physics of failure approach
Adithya Thaduri +4 more
openalex +2 more sources
Exciton Binding Energy Modulation in 2D Perovskites: A Phenomenological Keldysh Framework
The intrinsic screening effects are successfully decoupled from structural distortion by rigorously designing a series of 2D perovskites. This enabled us to demonstrate how the dielectric environment modulates the quasiparticle bandgap and exciton binding energy.
Kitae Kim +15 more
wiley +1 more source
A Fully Integrated Monolithic Monitor for Aging-Induced Leakage Current Characterization. [PDF]
Darko EN +4 more
europepmc +1 more source

