Results 191 to 200 of about 2,332,362 (329)

Spectroscopic Evaluation of AlN/n-Si MIS Structures through Frequency-Driven Dielectric Characterization. [PDF]

ACS Omega
Karaca A, Yıldız DE, Ertuğrul Uyar R, Tataroğlu A.   +3 more
europepmc   +1 more source

Bioinspired Adaptive Sensors: A Review on Current Developments in Theory and Application

Advanced Materials, EarlyView.
This review comprehensively summarizes the recent progress in the design and fabrication of sensory‐adaptation‐inspired devices and highlights their valuable applications in electronic skin, wearable electronics, and machine vision. The existing challenges and future directions are addressed in aspects such as device performance optimization ...
Guodong Gong, You Zhou, Qingxiu Li, Wenyu Zhao, Sunyingyue Geng, Hangfei Li, Yan‐Bing Leng, Shirui Zhu, Guanglong Ding, Yongbiao Zhai, Ziyu Lv, Ye Zhou, Su‐Ting Han   +12 more
wiley   +1 more source

Thermal management of 3-D heterogeneously integrated microelectronics: challenges and future research directions. [PDF]

Commun Eng
Sharma MK, Ramos-Alvarado B.
europepmc   +1 more source

Reliability of X‐ray Photoelectron Spectroscopy for Investigating Schottky Barriers at the Metal–Semiconductor Interfaces

João Eurico Fonseca, Borja Caja-Muñoz, Archit Dhingra   +2 more
openalex   +2 more sources

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts [PDF]

Vitor A. P. Aguiar, Saulo G. Alberton, Matheus S. Pereira   +2 more
openalex   +1 more source

Artificial Intelligence‐Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling

Advanced Materials, EarlyView.
AI‐Assisted Workflow for (Scanning) Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling. Abstract (Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of ...
Marc Botifoll, Ivan Pinto‐Huguet, Enzo Rotunno, Thomas Galvani, Catalina Coll, Payam Habibzadeh Kavkani, Maria Chiara Spadaro, Yann‐Michel Niquet, Martin Børstad Eriksen, Sara Martí‐Sánchez, Georgios Katsaros, Giordano Scappucci, Peter Krogstrup, Giovanni Isella, Andreu Cabot, Gonzalo Merino, Pablo Ordejón, Stephan Roche, Vincenzo Grillo, Jordi Arbiol   +19 more
wiley   +1 more source

Recent Progress in Structural Integrity Evaluation of Microelectronic Packaging Using Scanning Acoustic Microscopy (SAM): A Review. [PDF]

Sensors (Basel)
Meshki Zadeh P, Brand S, Dehghan-Niri E.
europepmc   +1 more source

Text Mining of CVD Synthesis Recipes for 2D Materials

Advanced Materials, EarlyView.
A lightweight, multi‐stage natural language processing framework utilizes fine‐tuned BERT models to extract chemical vapor deposition synthesis knowledge from diverse 2D materials literature. The domain‐adapted workflow integrates classification, named entity recognition, and extractive question answering to systematically retrieve categorical and ...
Ang‐Yu Lu, Richard A. Chen, Aijia Yao, Meng‐Chi Chen, Ji‐Hoon Park, Tianyi Zhang, Xudong Zheng, Nannan Mao, Jiangtao Wang, Zhien Wang, Tomás Palacios, Jing Kong   +11 more
wiley   +1 more source

Applicability Analysis of High-Voltage Transmission and Substation Equipment Based on Silicon Carbide Devices. [PDF]

Micromachines (Basel)
Zhang H, Nie M, Dong Q, Liu H, Jia P, Li Z, Fang Y.   +6 more
europepmc   +1 more source

A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation Mechanisms [PDF]

Joseph B. Bernstein, Tsuriel Avraham, Bin Wang   +2 more
openalex   +1 more source