Reliability study of Au-In transient liquid phase bonding for SiC power semiconductor packaging [PDF]
Brian Grummel+3 more
openalex +1 more source
This work utilizes poly(heptazine imides) as a model system to demonstrate how fine‐tuning the crystal structure influences the photocatalytic properties of layered carbon nitrides in the hydrogen evolution reaction. In particular, the nature of rotational defects and the hydration shell of cations are key contributors to enhanced hydrogen evolution ...
Diana V. Piankova+11 more
wiley +1 more source
Review on the Thermal Models Applications in the Reliability of Power Semiconductor Device
Jun Zhang+3 more
openalex +1 more source
Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications [PDF]
W. H. Liu+4 more
openalex +1 more source
Toward the 3rd Generation of Smart Farming: Materials, Devices, and Systems for E‐Plant Technologies
This review explores the latest developments in e‐plant technologies, which are revolutionizing smart farming by enabling real‐time monitoring of plant and environmental conditions. It covers the design, applications, and systems of e‐plant devices, detailing how they integrate data analytics to optimize agricultural practices, enhance crop yields, and
Daegun Kim+5 more
wiley +1 more source
Erratum: “Work function tuning and improved gate dielectric reliability with multilayer graphene as a gate electrode for metal oxide semiconductor field effect device applications” [Appl. Phys. Lett. 100, 233506 (2012)] [PDF]
Abhishek Misra+6 more
openalex +1 more source
Photoresponsive Gas‐Permeable Membranes: Fundamentals, Innovations, and Prospects
Photoresponsive gas‐permeable membranes can be potentially used for smart packing, carbon capture, hydrogen purification, and optical gas valves due to their remote and non‐contact activation, precise spatial and temporal control, and reversible switching capabilities.
Zhuan Wang+6 more
wiley +1 more source
The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms [PDF]
Zixuan Sun+4 more
openalex +1 more source