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Reliability assessment of power semiconductor devices

2016 19th International Symposium on Electrical Apparatus and Technologies (SIELA), 2016
This paper concerns some issues related to failures that occurred in power semiconductor devices. A review of basic requirements aimed at normal and reliable operation of semiconductor components is done by using reliability prediction approaches and prognostic methods.
Anton Georgiev   +2 more
openaire   +2 more sources

Reliability Assessment of Power Semiconductor Devices for a 13-Level Boost Inverter Topology

IEEE transactions on power electronics, 2023
Over the past few decades, research on multilevel inverters (MLIs) has been growing in the power electronics field. The MLI is preferred over the conventional two-level converters due to its improved performance.
M. Siddique   +2 more
semanticscholar   +1 more source

Addressing Weak Links in Automotive Reliability Semiconductor Contamination Control, Inspection and Test

International Integrated Reliability Workshop, 2020
As we move into a more electrified and automated reality, the sustainability of functional safe and secure electronic systems is a major concern of automobile manufacturers.
A. Aal   +3 more
semanticscholar   +1 more source

Reliability Enhancement of a Power Semiconductor With Optimized Solder Layer Thickness

IEEE transactions on power electronics, 2020
This article deals with the reliability of a power semiconductor exposing to the severe thermal stresses. The importance of solder joint thickness on the power semiconductor's useful lifetime is demonstrated in this article.
E. R.   +5 more
semanticscholar   +1 more source

A Mission-Profile-Based Tool for the Reliability Evaluation of Power Semiconductor Devices in Hybrid Electric Vehicles

International Symposium on Power Semiconductor Devices and IC's, 2020
Due to increasing environmental concerns, hybrid electric vehicles (HEVs) are gaining more and more attention. However, the reliability aspect performance of the power electronic system can be a limiting factor, and can increase the overall life-cycle ...
I. Vernica, Huai Wang, F. Blaabjerg
semanticscholar   +1 more source

Review on the Reliability Mechanisms of SiC Power MOSFETs: A Comparison Between Planar-Gate and Trench-Gate Structures

IEEE transactions on power electronics, 2023
To clarify the current research situation and offer a better understanding of the reliability for silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (mosfets), a comparison among the reliability mechanisms between planar-gate (
Jiaxing Wei   +10 more
semanticscholar   +1 more source

Achieving semiconductor equipment reliability

Proceedings. Seventh IEEE/CHMT International Electronic Manufacturing Technology Symposium, 2003
It is noted that the increasing complexity of semiconductor manufacturing processes and the competitiveness of worldwide device production demand step function improvements in production equipment reliability and predictability of its availability for use.
D. Ditmore   +3 more
openaire   +1 more source

Fast Semiconductor Reliability Assessments Using SPRT

IEEE Transactions on Reliability, 2019
The semiconductor manufacturing is one of the most sophisticated processes in modern industries. It contains hundreds of complex operations, and this makes semiconductor reliability a challenging task especially in recent years that integrated circuits ...
W. Chien, Andrew Chung, W. Kuo
semanticscholar   +1 more source

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