Results 261 to 270 of about 99,199 (301)

Reliability Of Ingaasp Semiconductor Lasers

SPIE Proceedings, 1987
The degradation mechanisms and reliability assurance strategies of InGaAsP semiconductor lasers that are currently being used in many commercial lightwave systems are discussed.
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Reliability assessment of power semiconductor devices

2016 19th International Symposium on Electrical Apparatus and Technologies (SIELA), 2016
This paper concerns some issues related to failures that occurred in power semiconductor devices. A review of basic requirements aimed at normal and reliable operation of semiconductor components is done by using reliability prediction approaches and prognostic methods.
Nikolay Nikolov, Anton Georgiev, Toncho Papanchev   +2 more
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Reliability test for subsea power semiconductors

Microelectronics Reliability, 2020
Abstract Following the demand from a new domain of application, a test setup was developed to evaluate the performance of high-power semiconductor device when exposed to a dielectric liquid and high pressure. The specific test conditions were established to emulate the conditions inside a tank place in a deep-sea environment.
David Guillon, Jean-Marc Oppliger, Franc Dugal, Heinz Lendenmann, Barbara Scherrer   +4 more
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The reliability of semiconductor devices in the bell system

Proceedings of the IEEE, 1974
The history of reliability of semiconductor devices in the Bell System is a story of sequential application of principles-first, of reliability-enhancing processing principles, which are applied in the absence of completely knowledgeable design and testing control; second, of testing-control principles, which follow growing knowledge of process defects
D.S. Peck, C.H. Zierdt
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Who Wants Reliable Plastic Semiconductors?

11th Reliability Physics Symposium, 1973
It has been found that a tri-layer metal contact system, consisting of platinum silicide-titanium-platinum-gold, is at least a factor of five better than a comparable aluminum metalized device with respect to humidity. However, all gold metalized devices are not necessarily this good; an example is given.
G. Malinowski, Edward B. Hakim, R. Holevinski   +2 more
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Metallization Reliability and Defectivity in Compound Semiconductors

ECS Meeting Abstracts, 2015
Compound semiconductor devices are in mass volume production yet our understanding of reliability and defectivity of III-V materials is still evolving.  Process-induced defects in electroplated Au interconnect metallization on GaAs devices were detected during the course of reliability testing.
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Reliability of semiconductor devices - The need for simulation

2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2011
Reliability requirements for semiconductor devices have increased tremendously in the past years. However, product qualification is still dominated by standard stress test procedures. Despite improved approaches that have entered the discussion recently, testing alone will not suffice to prove very low failure rates.
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Reliability Testing of Semiconductor Devices in a Humid Environment

Journal of the IEST, 1993
The influence of humidity on semiconductor device reliability is investigated with two main purposes: to emphasize the role of humidity in the failure process as a stress factor and to model the reliability-humidity relationship. Experiments were performed on two types of plastic encapsulated semiconductor devices (optoelectronic and ICs).
Marius Bazu, Mihai Tazlauanu
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Status of Compound Semiconductor Device Reliability

1990
A review is made of compound semiconductor device reliability from the period 1980 to the present. Emphasis is placed on technology based on field effect transistors (FETs). Many reliability studies were made of small signal GaAs FETs in the 1970s and of GaAs power FETs in the 1980’s; a substantial reliability base exists for these devices.
W. T. Anderson, A. Christou
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Historical review of compound semiconductor reliability

Microelectronics Reliability, 2006
This discussion is meant to look back at reliability progress over the last thirty years and identify trends and shortcomings. The main body of published work came from the ROCS workshop. While the workshop addresses various specific issues individually, it is the accumulation of a variety of data, information, and experience which forms the basis of ...
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