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Reliability analysis based on the Wiener process integrated with historical degradation data
Quality and Reliability Engineering International, 2023For high‐reliability and long‐life electronic devices, reliability analyses based on degradation data with small sample sizes are an outstanding question.
Wenda Kang +6 more
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Who Wants Reliable Plastic Semiconductors?
11th Reliability Physics Symposium, 1973It has been found that a tri-layer metal contact system, consisting of platinum silicide-titanium-platinum-gold, is at least a factor of five better than a comparable aluminum metalized device with respect to humidity. However, all gold metalized devices are not necessarily this good; an example is given.
E. B. Hakim +2 more
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Semiconductor network reliability assessment
Proceedings of the IEEE, 1964The paper discusses the reliability test plan and test results on semiconductor network microelectronic devices. Included in the test plan are reliability programs, life testing, step stress testing, and environmental tests. The failure analysis-corrective action cycle is discussed at length.
J. Adams, W. Workman
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Elements of semiconductor-device reliability
Proceedings of the IEEE, 1974Semiconductor-device quality and reliability are discussed in the context of the major factors producing failures, the relationship of process technology and its control to device quality and reliability, the testing procedures used to determine quality levels, and screening procedures that can be employed to segregate certain levels of device quality.
C.G. Peattie +4 more
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6G Roadmap for Semiconductor Technologies: Challenges and Advances
IEEE International Reliability Physics Symposium, 2022The sub-THz spectrum between 100GHz and 300GHz is of great interest for achieving next generation 6G cellular network goals of ultra-high data rate, ultra-low latency and high sensing precision.
N. Cahoon, P. Srinivasan, F. Guarín
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Semiconductor laser reliability
SPIE Proceedings, 1998In this paper, a review of the state-of-the-art in semiconductor laser diode reliability is presented, with a particular regard to the reliability of laser diodes used in long-distance telecommunication system. Remarkable advances in semiconductor laser reliability have been demonstrated over their thirty year history, leading to estimated median ...
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Optical semiconductor device reliability
Microelectronics Reliability, 2002Abstract Based on the degradation modes and mechanisms clarified in 1980s and 1990s, reliability of laser diodes and photodiodes is discussed for application to current optical fiber networks such as communication systems employing wavelength-division-multiplexing technique (WDM), high-frequency modulation technique, etc.
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Reliability of compound semiconductor devices
Microelectronics Reliability, 1992Abstract This paper reviews the reliability of III–V semiconductor devices with particular attention to the failure mechanisms typical of these structures. Instability effects at the surface of various FETs have been examined and the problems related to the metallurgies employed.
FANTINI, Fausto, F. MAGISTRALI
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A Survey of EMI Research in Power Electronics Systems With Wide-Bandgap Semiconductor Devices
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2020Wide-bandgap (WBG) power semiconductor devices have become increasingly popular due to their superior characteristics compared to their Si counterparts.
Boyi Zhang, Shuo Wang
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Reliability of semiconductor devices
Physics in Technology, 1976Report on Metallization systems for semiconductor devices, 13 February 1976 Imperial College, London.
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