Results 31 to 40 of about 121,599 (302)

Investigating the Failure Mechanism of p-GaN Gate HEMTs under High Power Stress with a Transparent ITO Gate

Micromachines, 2023
The channel temperature distribution and breakdown points are difficult to monitor for the traditional p-GaN gate HEMTs under high power stress, because the metal gate blocks the light.
Zhanfei Han, Xiangdong Li, Hongyue Wang, Jiahui Yuan, Junbo Wang, Meng Wang, Weitao Yang, Shuzhen You, Jingjing Chang, Jincheng Zhang, Yue Hao   +10 more
doaj   +1 more source

VLSI Reliability in Europe [PDF]

, 1993
Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described.
Verweij, J.F., Verweij, Jan F.
core   +2 more sources

Semiconductor Packaging [PDF]

, 2016
In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package.
Chen, Andrea, Lo, Randy Hsiao-Yu
openaire   +3 more sources

WBG-Based PEBB Module for High Reliability Power Converters

IEEE Access, 2021
The increasing presence of power electronic converters in the modern world – from electric vehicles, up to industrial applications – brings up concerns about their reliability, especially in the case of the Wide Band-Gap (WBG) devices ...
Sebastian Baba, Serafin Bachman, Marek Jasinski, Marcin Zelechowski   +3 more
doaj   +1 more source

Developing the knowledge-based human resources that support the implementation of the National Dual Training System (NDTS): evaluation of TVET teacher's competency at MARA Training Institutions [PDF]

, 2015
Development in the world of technical and vocational education and training (TVET) on an ongoing basis is a challenge to the profession of the TVET-teachers to maintain their performance.
Ali, Mahazani
core   +1 more source

Optimization Strategy of 4H-SiC Separated Absorption Charge and Multiplication Avalanche Photodiode Structure for High Ultraviolet Detection Efficiency

Nanoscale Research Letters, 2019
In this work, parametric investigations on structural optimization are systematically made for 4H-SiC-based separated absorption charge and multiplication (SACM) avalanche ultraviolet photodiode (UV APD).
Jianquan Kou, KangKai Tian, Chunshuang Chu, Yonghui Zhang, Xingye Zhou, Zhihong Feng, Zi-Hui Zhang   +6 more
doaj   +1 more source

Multi-Threshold Corner Detection and Region Matching Algorithm Based on Texture Classification

IEEE Access, 2019
In order to address the unreasonable distributed corners in single threshold Harris detection and expensive computation cost incurred from image region matching performed by normalized cross correlation (NCC) algorithm, multi-threshold corner detection ...
Zetian Tang, Zhao Ding, Ruimin Zeng, Yang Wang, Jun Wen, Lifeng Bian, Chen Yang   +6 more
doaj   +1 more source

Electrical Noise and Semiconductor Reliability

Electrotehnica, Electronica, Automatica, 2023
Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
openaire   +3 more sources

Accelerating Transistor Simulations With Self-Supervised Graph Attention Networks

IEEE Access
Technology CAD (TCAD) tools are pivotal for transistor modeling, enabling physics-based simulations with high accuracy essential for developing next-generation technology nodes. However, their high computational cost and low throughput severely constrain
Tarek Mohamed, Hussam Amrouch
doaj   +1 more source

Radiation Pattern Measurement in the Planar Coordinate

IEEE Photonics Journal, 2019
A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively.
Chen Yang, Yi-hao Wang, Yi Wang, Zhao Ding, Jun Wen, Li-Feng Bian   +5 more
doaj   +1 more source