Results 81 to 90 of about 99,199 (301)

Numerical modelling of a high temperature power module technology with SiC devices for high density power electronics [PDF]

open access: yes, 2012
This paper presents the development of a new packaging technology using silicon carbide (SiC) power devices. These devices will be used in the next power electronic converters.
Carrillo, Francisco Javier   +4 more
core  

Superconducting proximity effect in epitaxial Al-InAs heterostructures

open access: yes, 2019
Semiconductor-based Josephson junctions provide a platform for studying proximity effect due to the possibility of tuning junction properties by gate voltage and large-scale fabrication of complex Josephson circuits.
Dartiailh, Matthieu C.   +5 more
core   +1 more source

Technological sustainable materials and enabling in semiconductor memory industry: A review

open access: yese-Prime: Advances in Electrical Engineering, Electronics and Energy, 2023
This paper provides an overview of current and future deployment of recyclable direct materials and sustainable materials through recycling of interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical
Chong Leong Gan   +4 more
doaj  

Spectroelectrochemical Determination of Förster Radii for Triplet‐Polaron Quenching in Phosphorescent Organic Light‐Emitting Diodes

open access: yesAdvanced Functional Materials, EarlyView.
Phosphorescent OLEDs suffer from efficiency roll‐off due to triplet‐polaron quenching (TPQ). This study demonstrates for a large set of host‐guest combinations a spectroelectrochemical method to measure the absorption of charged molecules, enabling determining TPQ Förster radii (2.5–4 nm) from the spectral overlap.
Stan E. A. Jaspars   +5 more
wiley   +1 more source

Intrinsic Reliability improvement in Biaxially Strained SiGe p-MOSFETs

open access: yes, 2010
In this letter we not only show improvement in the performance but also in the reliability of 30nm thick biaxially strained SiGe (20%Ge) channel on Si p-MOSFETs.
Bersuker, Gennadi   +7 more
core   +1 more source

Research methods of reliability indicators of rectifier diode in tablet execution

open access: yesEPJ Web of Conferences, 2015
A new forecast approach for the reliability of power semiconductor devices in cyclic operation on the basis of numerical analysis of nonuniform temperature fields is offered.
Rinat Kurmangaliev, Evgeny Kravchenko
doaj   +1 more source

High‐Entropy Magnetism of Murunskite

open access: yesAdvanced Functional Materials, EarlyView.
The study of murunskite (K2FeCu3S4) reveals that its magnetic and orbital order emerges in a simple I4/mmm crystal structure with complete disorder in the transition metal positions. Mixed‐valence Fe ions randomly occupy 1/4 of the tetrahedral sites, with the remaining 3/4 being filled by non‐magnetic Cu+ ions.
Davor Tolj   +18 more
wiley   +1 more source

Characterization of High Temperature Optocoupler for Power Electronic Systems [PDF]

open access: yes, 2019
High-temperature devices have been rapidly increas due to the implementation of new technologies like silicon carbide, high-temperature ceramic, and others. Functionality under elevated temperatures can reduce signal integrity reducing the reliability of
Gonzalez, David
core   +2 more sources

Logarithmic behavior of degradation dynamics in metal--oxide semiconductor devices

open access: yes, 2010
In this paper the authors describe a theoretical simple statistical modelling of relaxation process in metal-oxide semiconductor devices that governs its degradation.
da Silva R   +3 more
core   +1 more source

Increase resource power electronics module on the physics of failure method

open access: yesMATEC Web of Conferences, 2014
A new approach to improving resource devices for power electronics. The numerical analysis of non-uniform temperature field of power semiconductor devices. A comparison of the intensities of the failure of a power unit with the real thermal regime of the
Kravchenko Evgeny V., Kuznetsov Geniy V.
doaj   +1 more source

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