Results 251 to 260 of about 14,908,555 (316)
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IEEE Electron Device Letters, 2021
In this work, a new operation scheme is developed to improve the state stability of multi-level resistive random-access memory (RRAM) array. We found that the state instability after programming is mainly derived from the excessive oxygen vacancies ...
Yu-Lin Feng +8 more
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In this work, a new operation scheme is developed to improve the state stability of multi-level resistive random-access memory (RRAM) array. We found that the state instability after programming is mainly derived from the excessive oxygen vacancies ...
Yu-Lin Feng +8 more
semanticscholar +1 more source
ACS Nano
Two-dimensional (2D) halide perovskites have become a promising class of memristive materials due to their low power consumption, compositional versatility, and microstructural anisotropy in electronics.
Seung Ju Kim +6 more
semanticscholar +1 more source
Two-dimensional (2D) halide perovskites have become a promising class of memristive materials due to their low power consumption, compositional versatility, and microstructural anisotropy in electronics.
Seung Ju Kim +6 more
semanticscholar +1 more source
Selector Failure Detection for Resistive Random Access Memories
2021 IEEE International Symposium on Information Theory (ISIT), 2021The sneak path (SP) interference problem in resistive random access memory (ReRAM) severely affects the data storage reliability. Recent works showed that the occurrence of the SP is highly related to the selector failures (SFs) in the resistive memory arrays.
Guanghui Song +4 more
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Engineering of defects in resistive random access memory devices
, 2020Defects are essential to switch the resistance states in resistive random-access memory (RRAM) devices. Controlled defects in such devices can lead to the stabilization of the switching performance, which is useful for high-density memory and ...
W. Banerjee, Qi Liu, H. Hwang
semanticscholar +1 more source
Physica Status Solidi (a), 2019
Because conventional nonvolatile memory is limited by process technology and physical size, resistive random access memory (RRAM) gradually enters the field of view due to its simple structure, fast program/erase speed, low power consumption, and so on ...
Hong Wang, Xiaobing Yan
semanticscholar +1 more source
Because conventional nonvolatile memory is limited by process technology and physical size, resistive random access memory (RRAM) gradually enters the field of view due to its simple structure, fast program/erase speed, low power consumption, and so on ...
Hong Wang, Xiaobing Yan
semanticscholar +1 more source
Four-Bits-Per-Memory One-Transistor-and-Eight-Resistive-Random-Access-Memory (1T8R) Array
IEEE Electron Device Letters, 2021We demonstrate a 1MBit array of 1-Transistor-8-Resistive RAM (1T8R) memory fabricated using a foundry logic technology. Using a gradual SET/RESET programming scheme, sixteen conductance levels are stored in each RRAM, achieving 1T8R array with 4 bits per
E. Hsieh +7 more
semanticscholar +1 more source
Advanced Electronic Materials, 2020
This study demonstrates a synergistic approach of dual nanostructure engineering to improve the performance of AlOx‐based resistive random access memory (RRAM) devices.
S. Maikap, W. Banerjee
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This study demonstrates a synergistic approach of dual nanostructure engineering to improve the performance of AlOx‐based resistive random access memory (RRAM) devices.
S. Maikap, W. Banerjee
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Noise in Resistive Random Access Memory Devices
2020This chapter is arranged as a bottom-up journey through the most important noise type in emerging resistive random access memory (RRAM) devices: random telegraph noise (RTN). In the last 10 years, RRAMs have gained enormous popularity and attracted the attention of many researchers and industries throughout the world.
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Access Strategies for Resistive Random Access Memory (RRAM)
ECS Transactions, 2012In an RRAM array, it is important to avoid sneak current paths that result in inadvertent, non-negligible voltage and current inputs to unselected cells. At the same time, care must be taken not to allow excessive voltages or currents to selected cells, which could result in damage.
Frederick T. Chen +14 more
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Resistive Random Access Memory: A Review of Device Challenges
IETE Technical Review, 2019With scaling, existing charge-based memory technologies exhibit limitations due to charge leaking away easily in a smaller device. Therefore, non-charge based memory technologies such as Resistive Random Access Memory (RRAM) become promising for future ...
Varshita Gupta +3 more
semanticscholar +1 more source

