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ACS Applied Electronic Materials, 2020
We report a switching model that directly explains the change in activation energy (EAC) at different RESET stop voltages (Vstop) in HfO2-based resistive random access memory devices.
D. Loy +6 more
semanticscholar +1 more source
We report a switching model that directly explains the change in activation energy (EAC) at different RESET stop voltages (Vstop) in HfO2-based resistive random access memory devices.
D. Loy +6 more
semanticscholar +1 more source
Advanced Functional Materials, 2019
Memory for skin‐attachable wearable devices for healthcare monitoring must meet a number of requirements, including flexibility and stability in external environments. Among various memory technologies, organic‐based resistive random‐access memory (RRAM)
Jin Hyeok Lee +3 more
semanticscholar +1 more source
Memory for skin‐attachable wearable devices for healthcare monitoring must meet a number of requirements, including flexibility and stability in external environments. Among various memory technologies, organic‐based resistive random‐access memory (RRAM)
Jin Hyeok Lee +3 more
semanticscholar +1 more source
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory
2015 45th European Solid State Device Research Conference (ESSDERC), 2015In this paper we explore the features of complex anomalous Random Telegraph Noise (aRTN) in TiN/Ti/HfO 2 /TiN Resistive Random Access Memory (RRAM) devices. Careful systematic experiment, dedicated characterization techniques, and physics-based simulations are exploited to gain insights into the physics of this phenomenon. The RTN parameters (amplitude
PUGLISI, Francesco Maria +3 more
openaire +3 more sources
Resistive Random Access Memory Variability and Its Mitigation Schemes
Journal of Low Power Electronics, 2017Peer ...
Pouman, Peyman +3 more
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Review on role of nanoscale HfO2 switching material in resistive random access memory device
Emergent Materials, 2022Napolean A +6 more
semanticscholar +1 more source
(Invited) Environmental Resistance of Resistive Random Access Memory
ECS Meeting Abstracts, 2016Environmental resistance of memory devices must be clarified for putting them into practical use. This should be emphasized in particular for resistance random access memory (ReRAM), which switching mechanism is still unclear, because responses to environmental stresses are closely related to the mechanism.
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