Results 1 to 10 of about 894 (89)

Extracting the Secrets of OpenSSL with RAMBleed [PDF]

open access: yesSensors, 2022
Concomitant with the increasing density of semiconductors, various attacks that threaten the integrity and security of dynamic random access memory (DRAM) have been devised.
Chihiro Tomita   +5 more
doaj   +2 more sources

Rowhammer Attacks in Dynamic Random-Access Memory and Defense Methods [PDF]

open access: yesSensors
This paper provides a comprehensive overview of the security vulnerability known as rowhammer in Dynamic Random-Access Memory (DRAM). While DRAM offers many desirable advantages, including low latency, high density, and cost-effectiveness, rowhammer ...
Dayeon Kim   +6 more
doaj   +2 more sources

RowHammer: Reliability Analysis and Security Implications [PDF]

open access: yes, 2016
As process technology scales down to smaller dimensions, DRAM chips become more vulnerable to disturbance, a phenomenon in which different DRAM cells interfere with each other's operation. For the first time in academic literature, our ISCA paper exposes
Daly, Ross   +8 more
core   +2 more sources

CYBER SECURITY IN INDUSTRIAL CONTROL SYSTEMS (ICS): A SURVEY OF ROWHAMMER VULNERABILITY [PDF]

open access: yesApplied Computer Science, 2022
Increasing dependence on Information and Communication Technologies (ICT) and especially on the Internet in Industrial Control Systems (ICS) has made these systems the primary target of cyber-attacks.
Hakan AYDIN , Ahmet SERTBAŞ
doaj   +1 more source

Uncovering In-DRAM RowHammer Protection Mechanisms:A New Methodology, Custom RowHammer Patterns, and Implications [PDF]

open access: yesMICRO-54: 54th Annual IEEE/ACM International Symposium on Microarchitecture, 2021
The RowHammer vulnerability in DRAM is a critical threat to system security. To protect against RowHammer, vendors commit to security-through-obscurity: modern DRAM chips rely on undocumented, proprietary, on-die mitigations, commonly known as Target Row Refresh (TRR).
Van der Veen, Victor   +5 more
openaire   +3 more sources

RowHammer: A Retrospective [PDF]

open access: yesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020
This retrospective paper describes the RowHammer problem in Dynamic Random Access Memory (DRAM), which was initially introduced by Kim et al. at the ISCA 2014 conference~\cite{rowhammer-isca2014}. RowHammer is a prime (and perhaps the first) example of how a circuit-level failure mechanism can cause a practical and widespread system security ...
Onur Mutlu, Jeremie S. Kim
openaire   +2 more sources

Residual vulnerabilities to power side channel attacks of lightweight ciphers cryptography competition finalists

open access: yesIET Computers &Digital Techniques, Volume 17, Issue 3-4, Page 75-88, May-July 2023., 2023
A comprehensive evaluation of the seven (out of 10) algorithm finalists of the NIST IoT lightweight cipher competition that do not integrate built‐in countermeasures is proposed. The study shows that, nonetheless, they still present some residual vulnerabilities to power SCA.
Aurelien T. Mozipo, John M. Acken
wiley   +1 more source

Intrinsic Rowhammer PUFs: Leveraging the Rowhammer effect for improved security [PDF]

open access: yes2017 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2017
Copyright held by IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any ...
Schaller, André   +6 more
openaire   +2 more sources

Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation

open access: yesIEEE Access, 2023
A novel memory cell transistor structure based on a saddle fin-based DRAM is presented for highly reliable operations. The overhang saddle fin (oss-fin) active structure is formed by two steps of etching of the fin; isotropic etching for the short side ...
Jin-Woo Han   +3 more
doaj   +1 more source

Characterization of Program Behavior under Faulty Instruction Encoding

open access: yesScientific Programming, Volume 2022, Issue 1, 2022., 2022
As process technology scales, electronic devices become more susceptible to soft errors. Soft errors can lead to silent data corruptions (SDCs), seriously compromising the reliability of a system. Researchers have explored error resilient encodings, which leverage crash patterns to detect SDCs.
Junchi Ma   +3 more
wiley   +1 more source

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