Neural Underpinnings of the Continuity Illusion in Musicians. [PDF]
Santoyo AE +3 more
europepmc +1 more source
A computational architecture incorporating shallow brain networks: integrating parallel cortical and subcortical processing. [PDF]
Lee K +4 more
europepmc +1 more source
Attentional bias for alcohol-related cues in a clinical setting among patients with alcohol use disorder: Evidence from eye movements and reaction times. [PDF]
Fuchs-Leitner I +4 more
europepmc +1 more source
The Connection Between Associative Memory and Semantic Similarity: Evidence From Fan Experiments and Distributional Models. [PDF]
Link P +3 more
europepmc +1 more source
Improvement of RTS Noise in HgCdTe MWIR Detectors
Random telegraph signal (RTS) noise is present in all bands of the infrared spectrum from λ c = 2.5 μm (short-wavelength infrared) to λ c = 15.75 μm (very long-wavelength infrared) and decreases the performance of infrared photodetectors.
Alexandre Brunner +2 more
exaly +4 more sources
Modeling random telegraph noise under switched bias conditions using cyclostationary rts noise [PDF]
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-channel MOSFETs under periodic large signal gate-source excitation (switched bias conditions). This is particularly relevant to analog CMOS circuit design where large signal swings occur and where LF noise is often a limiting factor in the performance of ...
L K J Vandamme, Bram Nauta
exaly +6 more sources
RTS noise characterization of HfOx RRAM in high resistive state
Abstract In this paper we analyze Random Telegraph Signal (RTS) noise and Power Spectral Density (PSD) in hafnium-based RRAMs. RTS measured in HRS exhibits fast and slow multilevel switching events. RTS characteristics are examined through novel color-coded time-lag plots and Hidden Markov Model (HMM) time-series analyses.
Francesco Maria Puglisi +2 more
exaly +3 more sources
Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models
Random telegraph signal (RTS) noise has shown an increased impact on circuit performance at advanced complementary metal-oxide-semiconductor technologies. However, there is not yet a computer-aided design tool available to analyze such noise based on the statistical distribution of traps.
Tong Boon Tang, Alan F Murray
exaly +3 more sources
RTS Noise Characterization in Single-Photon Avalanche Diodes
Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-μm CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-μm CMOS technology.
Mohammad Azim Karami +2 more
exaly +3 more sources

