Results 161 to 170 of about 11,597 (212)

Neural Underpinnings of the Continuity Illusion in Musicians. [PDF]

open access: yesEur J Neurosci
Santoyo AE   +3 more
europepmc   +1 more source

Improvement of RTS Noise in HgCdTe MWIR Detectors

open access: yesJournal of Electronic Materials, 2014
Random telegraph signal (RTS) noise is present in all bands of the infrared spectrum from λ c = 2.5 μm (short-wavelength infrared) to λ c = 15.75 μm (very long-wavelength infrared) and decreases the performance of infrared photodetectors.
Alexandre Brunner   +2 more
exaly   +4 more sources

Modeling random telegraph noise under switched bias conditions using cyclostationary rts noise [PDF]

open access: yesIEEE Transactions on Electron Devices, 2003
In this paper, we present measurements and simulation of random telegraph signal (RTS) noise in n-channel MOSFETs under periodic large signal gate-source excitation (switched bias conditions). This is particularly relevant to analog CMOS circuit design where large signal swings occur and where LF noise is often a limiting factor in the performance of ...
L K J Vandamme, Bram Nauta
exaly   +6 more sources

RTS noise characterization of HfOx RRAM in high resistive state

open access: yesSolid-State Electronics, 2013
Abstract In this paper we analyze Random Telegraph Signal (RTS) noise and Power Spectral Density (PSD) in hafnium-based RRAMs. RTS measured in HRS exhibits fast and slow multilevel switching events. RTS characteristics are examined through novel color-coded time-lag plots and Hidden Markov Model (HMM) time-series analyses.
Francesco Maria Puglisi   +2 more
exaly   +3 more sources

Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models

open access: yesIEEE Transactions on Circuits and Systems I: Regular Papers, 2010
Random telegraph signal (RTS) noise has shown an increased impact on circuit performance at advanced complementary metal-oxide-semiconductor technologies. However, there is not yet a computer-aided design tool available to analyze such noise based on the statistical distribution of traps.
Tong Boon Tang, Alan F Murray
exaly   +3 more sources

RTS Noise Characterization in Single-Photon Avalanche Diodes

open access: yesIEEE Electron Device Letters, 2010
Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-μm CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-μm CMOS technology.
Mohammad Azim Karami   +2 more
exaly   +3 more sources

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