Results 251 to 260 of about 1,123,144 (299)
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Fast compensation of current transformer saturation
2010 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT Europe), 2010This paper presents a novel method for current transformer (CT) saturation detection and compensation. In the method, CT saturation characteristics are represented by a partial nonlinear regression model. The parameters of this model can be estimated rapidly and accurately using both unsaturated and saturated sections of the waveform of a secondary ...
D. Y. Shi, J. Buse, Q. H. Wu, L. Jiang
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High-Saturation Current Wide-Bandwidth Photodetectors
IEEE Journal of Selected Topics in Quantum Electronics, 2004This paper describes the design and performance of two wide-bandwidth photodiode structures. The partially depleted absorber photodiode utilizes an absorbing layer consisting of both depleted and undepleted In/sub 0.53/Ga/sub 0.47/As layers. These photodiodes have achieved saturation currents (bandwidths) of >430 mA (300 MHz) and 199 mA (1 GHz) for 100-
D.A. Tulchinsky +5 more
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Saturation Current in Alloy Junctions
Proceedings of the IRE, 1955According to theory, the current which flows across a P-n junction when it is biased in the reverse direction should be nearly independent of the applied voltage. This current is called the saturation current, I8. In actual practice, the current often increases with voltage (due to leakage paths across the junction at the surface) and eventualy large ...
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Plasma Heating by Current-Saturation
Nature, 1959SEVERAL attempts have been made (for example in Zeta 1, Sceptre 2, Perhapstron 3, etc.) to produce high-temperature plasma in a toroidal discharge by means of large induced currents. These experiments have shown that Joule-heating of the plasma by the induced electron current is inefficient.
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Saturated-core resonant fault current limiter
2015 Clemson University Power Systems Conference (PSC), 2015In this paper, a new design of a series-type resonant fault current limiter (ReFCL), based on saturation effects, called a saturated-core ReFCL is presented. The saturable core used in the ReFCL plays two key roles, detector and limiter. The proposed ReFCL could be considered as a serious competitor of superconducting FCLs (SFCLs).
Morteza Rezaee +2 more
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Eddy-current losses in saturated cylinders
IEEE Transactions on Communication and Electronics, 1964This paper discusses the process of magnetization and the eddy-current losses in saturated cylinders subjected to a sinusoidal magnetic field. Maxwell's equations are solved in cylindrical co-ordinates for an assumed magnetization curve B = B s sign H.
B. Béland, J. Robert
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Pre-saturated core Fault Current Limiter
2013 Australasian Universities Power Engineering Conference (AUPEC), 2013Various Fault Current Limiter technologies are under development, all aimed at limiting fault current to a value within the sub-station plant capacity. A fully tested pre-saturated core fault current limiter (PSFCL), currently in live operation in a UK substation, is presented.
Mohinder Pannu, Yoram Valent, Uri Garbi
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Optical current sensors eliminate CT saturation
2002 IEEE Power Engineering Society Winter Meeting. Conference Proceedings (Cat. No.02CH37309), 2003Optical current sensors are achieving increased acceptance and use in high voltage substations due to their superior accuracy, bandwidth, dynamic range and inherent isolation. Once deemed specialized devices intended for novel applications, optical sensors have risen to a performance level exceeding conventional magnetic devices.
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Electrode current saturation in MHD ducts.
AIAA Journal, 1966|HE electrical conductivity of seeded gases in MHD experiJments has received considerable attention.; however very few experiments have allowed for the detailed effects of an electrode plasma interface on the conduction process. Electrical as well as thermal sheaths on the electrodes restrict the free exchange of charges and introduce severe saturation
J. F. ARMSTRONG +2 more
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Saturation Phenomenon of Stress Induced Gate Leakage Current
Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials, 2001The saturation phenomenon of stress-induced leakage currents (SILCs) is monitored with various stress voltages, gate oxide thicknesses and temperatures for gate oxides formed with different fabrication processes. It is found that there exist seeds of defects at the point when the gate oxide is fabricated and the number of the seeds determines the ...
Shuichi Ueno +5 more
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