Results 231 to 240 of about 393,105 (264)

Compressed pattern diagnosis for scan chain failures

IEEE International Conference on Test, 2005., 2006
In scan based designs, 10%-30% defects are in scan chains. Hence scan chain fault diagnosis becomes an important process for silicon debug and yield ramp up. With embedded compression techniques getting popular, chain diagnosis on devices with the embedded compression techniques becomes a challenge.
Yu Huang 0005, Wu-Tung Cheng, Janusz Rajski   +2 more
openaire   +1 more source

Laser scanning for semiconductor mask pattern generation

Proceedings of the IEEE, 2002
The use of laser scanning to generate semiconductor masks is reviewed. Following a brief historical introduction that describes early pattern generator implementations, current and future industry mask requirements are described with the consequences for pattern generator design: the need for small features, tight CD control, and high pixel delivery ...
openaire   +1 more source

Fast Constrained Subset Scanning for Pattern Detection

2014
Information Systems and ...
openaire   +1 more source

Concurrent scan monitoring and multi-pattern search

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646), 2002
Accompanying the needs of many critical applications of electronic devices, on-line tests are increasingly required. Non-intrusive concurrent scan monitoring is an easy-to-implement vector-based testing procedure, handicapped by two main factors: the interval for operating vectors to match test patterns and test data to be stored. The paper presents an
openaire   +1 more source

Trueness and precision of combined healing abutment-scan body system depending on the scan pattern and implant location: An in-vitro study

Journal of Dentistry, 2022
Mustafa Borga Donmez, Gülce Cakmak, Burak Yilmaz   +2 more
exaly  

Scanning Behaviour and Pattern Recognition

2013
Two basic models of human pattern recognition have been advanced: feature analysis and hypothesis testing. These can only be discriminated by looking at behaviour before recognition. This is studied here by having the subject scan with a pen that writes only where the (invisible) picture is black.
openaire   +1 more source

Effect of scan pattern on Hastelloy-X wall structures built by laser-directed energy deposition-based additive manufacturing

Journal of Micromanufacturing, 2021
Jinoop Arackal Narayanan, S Yadav, C P Paul   +2 more
exaly  

SCANNING THE RECEIVING-BEAM PATTERN

Telecommunications and Radio Engineering, 2012
K. V. Filatov, I. G. Miroshnikov
openaire   +1 more source

Assessment on the wear failure of additively manufactured stainless steel 316L with different scan pattern in simulated body fluid condition

Engineering Failure Analysis, 2023
S Arulvel
exaly  

SEMIAUTOMATED PATTERNED SCANNING LASER FOR RETINAL PHOTOCOAGULATION

Retina, 2006
Mark S, Blumenkranz, Dimitri, Yellachich, Dan E, Andersen, Michael W, Wiltberger, David, Mordaunt, George R, Marcellino, Daniel, Palanker   +6 more
openaire   +2 more sources