Results 241 to 250 of about 30,748 (322)

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy. [PDF]

Beilstein J Nanotechnol
Rohrbeck PN, Cavar LD, Weber F, Reichel PG, Niebling M, Weber SAL.   +5 more
europepmc   +1 more source

Electrical Response of Different Crystalline Microregions in Poly(vinylidene fluoride). [PDF]

Nanomaterials (Basel)
Su M, Zhou J, Chen Y, Wang Y, Jin G, Wang H, Zhou J, Pang X, Lv Z, Wu K.   +9 more
europepmc   +1 more source

Metallic tellurium for p-type contacts of two-dimensional MoTe₂ field-effect transistors. [PDF]

Nat Commun
Zhu Y, Wang F, Li S, Shen C, Cai Y, Yan T, Zhang F, Wang Y, Zhan X, Xu K, Wang H, Zhang H, Wang Z, He J.   +13 more
europepmc   +1 more source

Kelvin Probe Force Microscopy in Bionanotechnology: Current Advances and Future Perspectives.

Advanced Materials, EarlyView.
Kelvin probe force microscopy (KPFM) is a highly advanced technique offering notable surface sensitivity and high lateral resolution, ranging from micrometres to the sub-nanometre scale.
Ehsan Rahimi, Mario Palacios‐Corella, A. Mol, Salvador Pané, Josep Puigmartí‐Luis   +4 more
semanticscholar   +2 more sources

Some of the next articles are maybe not open access.

Related searches:

Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Japanese Journal of Applied Physics, 2019
Scanning probe microscopy and corresponding evaluation methods enabled nanoscale observation of power semiconductor devices regardless of the material and structure types.
A. Doi, Mizuki Nakajima, Sho Masuda, N. Satoh, H. Yamamoto   +4 more
semanticscholar   +2 more sources

Methods—On the Application of Ambient Scanning Kelvin Probe Force Microscopy to Understand Micro-Galvanic Corrosion Phenomena: Interpretation and Challenges

Journal of the Electrochemical Society, 2023
The capabilities of scanning Kelvin probe force microscopy (SKPFM) to directly measure local Volta potential differences with relatively high spatial resolution has made it a very popular technique to assess the relative nobility of intermetallic ...
R. Revilla
semanticscholar   +1 more source

In-situ visualization of hydrogen atom distribution at micro-indentation in a carbon steel by scanning Kelvin probe force microscopy

Corrosion reviews, 2023
In this work, a scanning Kelvin probe force microscope was used to in-situ visualize distribution of hydrogen atoms at micro-indentation and metallurgical phases contained in a carbon steel.
Yuan Li, Y. Cheng
semanticscholar   +1 more source

Determination of Work Function for p- and n-Type 4H-SiC Single Crystals via Scanning Kelvin Probe Force Microscopy

Chinese Physics Letters, 2023
Silicon carbide (SiC) is a promising platform for fabricating high-voltage, high-frequency and high-temperature electronic devices such as metal oxide semiconductor field effect transistors in which many junctions or interfaces are involved.
Hui 辉 Li 李, Guobin 国宾 Wang 王, Jingyu 靖宇 Yang 杨, Z. Zhang 张, J. Deng 邓, S. Du 杜   +5 more
semanticscholar   +1 more source

High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Electrochimica Acta, 2007
With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Rohwerder, M., Turcu, E.
openaire   +3 more sources

Practical aspects of single-pass scan Kelvin probe force microscopy

Review of Scientific Instruments, 2012
The single-pass scan Kelvin probe force microscopy (KPFM) in ambient condition has a few advantages over the dual-pass lift-up scan KPFM. For example, its spatial resolution is expected to be higher; and its topographical errors caused by electrostatic forces are minimized because electrostatic forces are actively suppressed during the simultaneous ...
Guangyong, Li, Bin, Mao, Fei, Lan, Liming, Liu   +3 more
openaire   +2 more sources