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Corrosion, 2014
The relative electrochemical properties of second phases compared to the surrounding matrix gives rise to localization of corrosion on magnesium (Mg) alloys. Localized corrosion and its subsequent propagation in Mg alloys is largely driven by so-called ‘microgalvanic coupling’ of microstructural constituents within the alloy microstructure.
Hurley, M. F. +5 more
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The relative electrochemical properties of second phases compared to the surrounding matrix gives rise to localization of corrosion on magnesium (Mg) alloys. Localized corrosion and its subsequent propagation in Mg alloys is largely driven by so-called ‘microgalvanic coupling’ of microstructural constituents within the alloy microstructure.
Hurley, M. F. +5 more
openaire +2 more sources
Delamination of organic coating on carbon steel studied by scanning Kelvin probe force microscopy
Surface and Interface Analysis, 2012Corrosion‐induced delamination of an epoxy coating on the AISI/SAE 1045 carbon steel was studied under a humid atmospheric condition (temperature of 25 °C, 1 standard atmospheric pressure, relative humidity of 90%) by the technique of scanning Kelvin probe force microscopy (SKPFM). Surface‐polished 1045 samples were first cold‐coated with the epoxy and
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Analytical Letters, 2012
Under the ambient temperature (25°C) and pressure (one Standard Atmospheric Pressure) conditions, surface Volta potential of an austenitic stainless steel was measured using the Scanning Kelvin Probe Force Microscopy (SKPFM) to study its stressed-related corrosion behavior in a 0.5 M chloride solution.
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Under the ambient temperature (25°C) and pressure (one Standard Atmospheric Pressure) conditions, surface Volta potential of an austenitic stainless steel was measured using the Scanning Kelvin Probe Force Microscopy (SKPFM) to study its stressed-related corrosion behavior in a 0.5 M chloride solution.
openaire +1 more source
Scanning Kelvin Probe Force Microscopy
Journal of The Electrochemical Society, 2004D. Bengtsson Blücher +4 more
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Kelvin probe force and scanning capacitance microscopy on MOS structures
2009Baumgart, C. +3 more
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