Results 251 to 260 of about 30,748 (322)
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Compensating electrostatic forces by single-scan Kelvin probe force microscopy
Nanotechnology, 2007We describe a novel method of single-scan Kelvin probe force microscopy, operating simultaneously with amplitude-modulation distance control in ambient air. A separate Kelvin probe feedback control loop compensates for potential differences between tip and sample by minimizing electrostatic forces.
Dominik Ziegler +3 more
openaire +1 more source
Japanese Journal of Applied Physics, 2020
Electrical properties of the wafer bonding p-GaAs/n-GaN, p-GaAs/n-Si and p-GaAs/ITO//ITO/n-Si are investigated systematically by scanning Kelvin probe force microscopy (KPFM), capacitance–voltage (C–V) and current–voltage (I–V) measurements.
Z. Xing +10 more
semanticscholar +1 more source
Electrical properties of the wafer bonding p-GaAs/n-GaN, p-GaAs/n-Si and p-GaAs/ITO//ITO/n-Si are investigated systematically by scanning Kelvin probe force microscopy (KPFM), capacitance–voltage (C–V) and current–voltage (I–V) measurements.
Z. Xing +10 more
semanticscholar +1 more source
, 2020
Contact resistance effects in n-type organic field-effect transistors (OFETs) based on perylene-diimide thin films and monolayer CVD graphene electrodes have been investigated by using Scanning Kelvin Probe Force Microscopy (SKPFM).
F. Chianese +5 more
semanticscholar +1 more source
Contact resistance effects in n-type organic field-effect transistors (OFETs) based on perylene-diimide thin films and monolayer CVD graphene electrodes have been investigated by using Scanning Kelvin Probe Force Microscopy (SKPFM).
F. Chianese +5 more
semanticscholar +1 more source
Journal of The Electrochemical Society, 2003
In this study, the Volta potential distribution over the surface of duplex stainless steels (DSSs) has been mapped for the first time with submicrometer resolution by scanning Kelvin probe force microscopy (SKPFM). The different magnetic properties of ferrite and austenite enable the utilization of magnetic force microscopy (MFM) for visualizing their ...
M. Femenia +3 more
openaire +1 more source
In this study, the Volta potential distribution over the surface of duplex stainless steels (DSSs) has been mapped for the first time with submicrometer resolution by scanning Kelvin probe force microscopy (SKPFM). The different magnetic properties of ferrite and austenite enable the utilization of magnetic force microscopy (MFM) for visualizing their ...
M. Femenia +3 more
openaire +1 more source
Japanese Journal of Applied Physics, 2016
Abstract We have developed a scanning probe microscope (SPM) that combines atomic force microscopy (AFM) with both Kelvin probe force microscopy (KFM — to measure the surface potential) and scanning capacitance force microscopy (SCFM — to measure the differential capacitance).
Takeshi Uruma +2 more
openaire +1 more source
Abstract We have developed a scanning probe microscope (SPM) that combines atomic force microscopy (AFM) with both Kelvin probe force microscopy (KFM — to measure the surface potential) and scanning capacitance force microscopy (SCFM — to measure the differential capacitance).
Takeshi Uruma +2 more
openaire +1 more source
Electrochemical and Solid-State Letters, 2008
A 2205 duplex stainless steel, which had undergone a slow cooling process in order to precipitate intermetallic phases, was characterized by means of magnetic force microscopy (MFM) and scanning Ke ...
Namurata Sathirachinda +3 more
openaire +1 more source
A 2205 duplex stainless steel, which had undergone a slow cooling process in order to precipitate intermetallic phases, was characterized by means of magnetic force microscopy (MFM) and scanning Ke ...
Namurata Sathirachinda +3 more
openaire +1 more source
Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy
2004In 1981, Gerd Binning and Heinrich Rohree at IBM Zurich developed the first generation of the scanning probe microscope, the scanning tunneling microscope for which they received the Noble Prize in physics. The Scanning Tunneling Microscope (STM) was a fantastic breakthrough with its capability to image atoms with angstrom precision.
C. Druffner +4 more
openaire +1 more source
2005
Scanning capacitance force microscopy and Kelvin probe force microscopy are used to image Sn nanometer sized structures embedded in silicon oxide thin films. The capacitance variation occurring between probe and sample in presence of a metallic cluster modifies the oscillation amplitude of the AFM probe at twice the frequency of the applied voltage ...
G Tallarida, S Spiga, M Fanciulli
openaire +2 more sources
Scanning capacitance force microscopy and Kelvin probe force microscopy are used to image Sn nanometer sized structures embedded in silicon oxide thin films. The capacitance variation occurring between probe and sample in presence of a metallic cluster modifies the oscillation amplitude of the AFM probe at twice the frequency of the applied voltage ...
G Tallarida, S Spiga, M Fanciulli
openaire +2 more sources
Micron, 2015
The use of scanning thermal microscopy (SThM) and Kelvin probe force microscopy (KPFM) to investigate silicon nanowires (SiNWs) is presented. SThM allows imaging of temperature distribution at the nanoscale, while KPFM images the potential distribution with AFM-related ultra-high spatial resolution.
Grzegorz Wielgoszewski +7 more
openaire +2 more sources
The use of scanning thermal microscopy (SThM) and Kelvin probe force microscopy (KPFM) to investigate silicon nanowires (SiNWs) is presented. SThM allows imaging of temperature distribution at the nanoscale, while KPFM images the potential distribution with AFM-related ultra-high spatial resolution.
Grzegorz Wielgoszewski +7 more
openaire +2 more sources