Results 271 to 280 of about 30,748 (322)
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ECS Meeting Abstracts, 2010
Abstract not Available.
Ceylan Senoez, Michael Rohwerder
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Abstract not Available.
Ceylan Senoez, Michael Rohwerder
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Nanotechnology
Theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy (KPFM) measurements has been challenging due to the complexity introduced by tip-induced band bending (TIBB). In this study,
Nobuyuki Ishida, T. Mano
semanticscholar +1 more source
Theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy (KPFM) measurements has been challenging due to the complexity introduced by tip-induced band bending (TIBB). In this study,
Nobuyuki Ishida, T. Mano
semanticscholar +1 more source
Scanning Kelvin Probe Force Microscopy as Tool for the Investigation of Localized Corrosion
ECS Meeting Abstracts, 2014In this presentation it will be shown that the Scanning Kelvin Probe Force Microscopy (SKPFM) is a powerful tool for the characterization of corrosion processes at the microscopic level, especially underneath organic coatings, see e.g. [1-3], but also on the uncoated surface, see e.g. [4].
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Scanning Kelvin Probe Force Microscopy
Journal of The Electrochemical Society, 2004D. Bengtsson Blücher +4 more
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Delamination of organic coating on carbon steel studied by scanning Kelvin probe force microscopy
Surface and Interface Analysis, 2012Corrosion‐induced delamination of an epoxy coating on the AISI/SAE 1045 carbon steel was studied under a humid atmospheric condition (temperature of 25 °C, 1 standard atmospheric pressure, relative humidity of 90%) by the technique of scanning Kelvin probe force microscopy (SKPFM). Surface‐polished 1045 samples were first cold‐coated with the epoxy and
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Analytical Letters, 2012
Under the ambient temperature (25°C) and pressure (one Standard Atmospheric Pressure) conditions, surface Volta potential of an austenitic stainless steel was measured using the Scanning Kelvin Probe Force Microscopy (SKPFM) to study its stressed-related corrosion behavior in a 0.5 M chloride solution.
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Under the ambient temperature (25°C) and pressure (one Standard Atmospheric Pressure) conditions, surface Volta potential of an austenitic stainless steel was measured using the Scanning Kelvin Probe Force Microscopy (SKPFM) to study its stressed-related corrosion behavior in a 0.5 M chloride solution.
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