Results 251 to 260 of about 2,228,604 (285)

Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy

2004
In 1981, Gerd Binning and Heinrich Rohree at IBM Zurich developed the first generation of the scanning probe microscope, the scanning tunneling microscope for which they received the Noble Prize in physics. The Scanning Tunneling Microscope (STM) was a fantastic breakthrough with its capability to image atoms with angstrom precision.
C. Druffner, E. Schumaker, S. Sathish, G. S. Frankel, P. Leblanc   +4 more
openaire   +1 more source

Practical aspects of single-pass scan Kelvin probe force microscopy

Review of Scientific Instruments, 2012
The single-pass scan Kelvin probe force microscopy (KPFM) in ambient condition has a few advantages over the dual-pass lift-up scan KPFM. For example, its spatial resolution is expected to be higher; and its topographical errors caused by electrostatic forces are minimized because electrostatic forces are actively suppressed during the simultaneous ...
Guangyong, Li, Bin, Mao, Fei, Lan, Liming, Liu   +3 more
openaire   +2 more sources

Scanning Kelvin Probe Microscopy of Electrode-Semiconducting Polymer Interfaces

2005 12th International Symposium on Electrets, 2006
The application of scanning Kelvin probe microscopy to polymer-electrode interfaces is described for a range of different device situations. Polarization effects arising from ionic drift are identified. Ohmic and rectifying contacts in lateral diodes are investigated as well as a MISFET with one Schottky contact.
D.M. Taylor, F.G. Martinez, J.A. Cambridge, D. Morris, M. Wraich, G. Faria   +5 more
openaire   +1 more source

Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation

Ultramicroscopy, 2021
Amplitude modulation scanning Kelvin probe microscopy (AM-SKPM) is widely used to measure the contact potential difference (CPD) between probe and samples in ambient or dry inert atmosphere. However, AM-SKPM is generally considered quantitatively inaccurate due to crosstalk between the cantilever and the sample. Here we demonstrate that the accuracy of
Junqi, Lai, Cheng, Wang, Zhiwei, Xing, Shulong, Lu, Qi, Chen, Liwei, Chen   +5 more
openaire   +2 more sources

Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

Japanese Journal of Applied Physics, 2016
Abstract We have developed a scanning probe microscope (SPM) that combines atomic force microscopy (AFM) with both Kelvin probe force microscopy (KFM — to measure the surface potential) and scanning capacitance force microscopy (SCFM — to measure the differential capacitance).
Takeshi Uruma, Nobuo Satoh, Hidekazu Yamamoto   +2 more
openaire   +1 more source

Compensating electrostatic forces by single-scan Kelvin probe force microscopy

Nanotechnology, 2007
We describe a novel method of single-scan Kelvin probe force microscopy, operating simultaneously with amplitude-modulation distance control in ambient air. A separate Kelvin probe feedback control loop compensates for potential differences between tip and sample by minimizing electrostatic forces.
Dominik Ziegler, Jörg Rychen, Nicola Naujoks, Andreas Stemmer   +3 more
openaire   +1 more source

Scanning Kelvin Probe Microscopy Study on Oxide Thin Film Transistor

ECS Transactions, 2013
Thin film transistors (TFT) using oxide channel like InGaZnO are very promising for the transparent and flexible electronics application because of their high performance and optical transparency compared with amorphous silicon or organic semiconductors.
J. -H. Park, Hong-Gi Cha
openaire   +1 more source

Scanning Kelvin Probe Microscopy Study of Mg-Zn-Ca Alloys

Volume 14: Emerging Technologies; Materials: Genetics to Structures; Safety Engineering and Risk Analysis, 2017
This study focused on understanding the interactions between alloying elements in a magnesium (Mg) matrix and the effect of the alloying elements on corrosion behavior of Mg-alloys. The development of atomic force microscope (AFM) techniques has enabled the evaluation of physical and chemical properties of surfaces at the sub-micron level.
Svitlana Fialkova, Zhigang Xu, Devdas Pai, Jagannathan Sankar   +3 more
openaire   +1 more source

Improve the Accuracy of Scanning Kelvin Probe Microscopy by Eliminating the Cantilever Effect

MRS Proceedings, 2004
ABSTRACTScanning Kelvin probe microscopy (SKPM) is widely used to measure surface work functions and electrostatic potentials on nanoscale circuits, devices and materials. However, the accuracy of scanning Kelvin probe microscopy is reduced by a cantilever effect, which is due to a large capacitance gradient associated with the cantilever. We introduce
Zhitao Yang, Michael G. Spencer
openaire   +1 more source

Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy

Micron, 2015
The use of scanning thermal microscopy (SThM) and Kelvin probe force microscopy (KPFM) to investigate silicon nanowires (SiNWs) is presented. SThM allows imaging of temperature distribution at the nanoscale, while KPFM images the potential distribution with AFM-related ultra-high spatial resolution.
Grzegorz Wielgoszewski, Piotr Pałetko, Daniel Tomaszewski, Michał Zaborowski, Grzegorz Jóźwiak, Daniel Kopiec, Teodor Gotszalk, Piotr Grabiec   +7 more
openaire   +2 more sources