Results 261 to 270 of about 2,228,604 (285)

Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy

Ultramicroscopy, 2009
Scanning Kelvin probe force microscopy was applied to the microelectrical characterizations of junctions in solar cell devices. Surface Fermi-level pinning effects on the surface potential measurement were avoided by applying a bias voltage (V(b)) to the device and taking the V(b)-induced potential and electric field changes.
C-S, Jiang, A, Ptak, B, Yan, H R, Moutinho, J V, Li, M M, Al-Jassim   +5 more
openaire   +2 more sources

A gold nano-dot modified silicon tip apex for scanning Kelvin probe microscopy

10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2015
In this paper, a gold nano-dot (Au-ND) is successfully prepared on a silicon tip apex for scanning Kelvin probe microscopy (SKPM) applications. An extra facile localized fluoride assisted Galvanic replacement reaction (LFAGRR) is proposed to replace the silicon (Si) atoms at the tip apex with Au ones. We successfully fabricated Au-ND coated tip apex by
Chun-Ting Lin, Ching-Hao Chen, Chien-Ting Wu, Chien-Nan Hsiao, Ming-Hua Shiao, Mao-Nan Chang   +5 more
openaire   +1 more source

Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy for Characterization of Duplex Stainless Steels

Journal of The Electrochemical Society, 2003
In this study, the Volta potential distribution over the surface of duplex stainless steels (DSSs) has been mapped for the first time with submicrometer resolution by scanning Kelvin probe force microscopy (SKPFM). The different magnetic properties of ferrite and austenite enable the utilization of magnetic force microscopy (MFM) for visualizing their ...
M. Femenia, C. Canalias, J. Pan, C. Leygraf   +3 more
openaire   +1 more source

Scanning Kelvin Probe Force Microscopy as Tool for the Investigation of Localized Corrosion

ECS Meeting Abstracts, 2014
In this presentation it will be shown that the Scanning Kelvin Probe Force Microscopy (SKPFM) is a powerful tool for the characterization of corrosion processes at the microscopic level, especially underneath organic coatings, see e.g. [1-3], but also on the uncoated surface, see e.g. [4].
openaire   +1 more source

Scanning Kelvin Probe Force Microscopy

Journal of The Electrochemical Society, 2004
D. Bengtsson Blücher, J.-E. Svensson, L.-G. Johansson, M. Rohwerder, M. Stratmann   +4 more
openaire   +1 more source

Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy

2015
We already used the term work function when we introduced the tunneling barrier height in STM. The work function can be considered as the energy difference between the vacuum level and the Fermi level of a metal. Here we will see that also a surface term contributes to the work function.
openaire   +1 more source

Scanning Kelvin Probe Force Microscopy

2012
Yimei Zhu, Hiromi Inada, Achim Hartschuh, Li Shi, Ada Della Pia, Giovanni Costantini, Amadeo L. Vázquez de Parga, Rodolfo Miranda, Antoine Barbier, Cristian Mocuta, Rachid Belkhou, Bharat Bhushan, J. H. Hoo, K. S. Park, R. Baskaran, K. F. Böhringer, Wei Lu, Michael Nosonovsky, Moon-Ho Ham, Ardemis A. Boghossian, Jong Hyun Choi, Michael S. Strano, Amy Lang, Maria Laura Habegger, Philip Motta, Bharat Bhushan, Thomas Bachmann, Hermann Wagner, Donald W. Brenner, Jian Chen, Nika Shakiba, Qingyuan Tan, Yu Sun, Julia R. Greer, M. Laver, S. M. Khaled, Alessandro Parodi, Ennio Tasciotti, Bakul C. Dave, Sarah B. Lockwood, Claudia Musicanti, Paolo Gasco, Fritz Vollrath, Alexander Booth, Andy C. McIntosh, Novid Beheshti, Richard Walker, Lars Uno Larsson, Andrew Copestake, Hyundoo Hwang, Yoon-Kyoung Cho, Jian Chen, Michael Chu, Claudia R. Gordijo, Xiao Yu Wu, Yu Sun, Mathias Kolle, Ullrich Steiner, Szu-Wen Wang, Frederik Ceyssens, Robert Puers, Xiaodong Han, Shengcheng Mao, Ze Zhang, Lei Jiang, Ling Lin, Regina Ragan, Vanni Lughi, Carlos Drummond, Marina Ruths, Weiqiang Mu, John B. Ketterson, Pierre Berini, Ya-Pu Zhao, Feng-Chao Wang, Shaurya Prakash, Simon J. Henley, José V. Anguita, S. Ravi P. Silva, Munish Chanana, Cintia Mateo, Verónica Salgueirino, Miguel A. Correa-Duarte, Swastik Kar, Saikat Talapatra, Javier Calvo Fuentes, José Rivas, M. Arturo López-Quintela, Soichiro Tsuda   +88 more
openaire   +1 more source

SCANNING KELVIN PROBE MICROSCOPY OF MULTI-WALLED CARBON NANOTUBES

Cluster and Nanostructure Interfaces, 2000
B. WALSH, D. B. JANES, E. GRAUGNARD, R. REIFENBERGER, P. J. DE PABLO, R. P. ANDRES   +5 more
openaire   +1 more source

Scanning Kelvin probe force microscopy and scanning Kelvin probe in investigation of effect of microstructure on corrosion behaviour of magnesium alloys

2007
M. Jönsson, D. Thierry, N. LeBozec
openaire   +1 more source

Scanning Kelvin Probe Force Microscopy

2016
openaire   +1 more source