Results 121 to 130 of about 1,828 (206)

Characterization of the 3D-Optical Properties of van der Waals Materials with Deep Learning-Based Coherent Fourier Scatterometry. [PDF]

ACS Photonics
Paul A, Rishav K, Klootwijk G, Sarkar M, Bisht O, Li Z, Conesa-Boj S, Papadakis GT, Pereira SF.   +8 more
europepmc   +1 more source

Design and Metrological Analysis of a Backlit Vision System for Surface Roughness Measurements of Turned Parts. [PDF]

Sensors (Basel), 2023
Baleani A, Paone N, Gladines J, Vanlanduit S.   +3 more
europepmc   +1 more source

Structure-in-Void Quasi-Bound State in the Continuum Metasurface for Deeply Subwavelength Nanostructure Metrology. [PDF]

ACS Nano
Bijloo F, den Boef AJ, Kraus PM, Koenderink AF.   +3 more
europepmc   +1 more source

Iridescence, polarisation and directionality of Morpho butterfly displays. [PDF]

J Comp Physiol A Neuroethol Sens Neural Behav Physiol
Sosa Espinosa J, Giraldo MA, Stavenga DG, van der Kooi CJ.   +3 more
europepmc   +1 more source

Real-time Optical Dimensional Metrology via Diffractometry for Nanofabrication. [PDF]

Sci Rep, 2020
Whitworth GL, Francone A, Sotomayor-Torres CM, Kehagias N.   +3 more
europepmc   +1 more source

Angle-resolved scatterometry combined with deep learning assisted in-situ monitoring of nanowire doping in molecular beam epitaxy process. [PDF]

Microsyst Nanoeng
Yang D, Song Y, Liang W, Zhang W, Shen W, Shen C, Liang K, Liu S.   +7 more
europepmc   +1 more source

<i>Morpho</i> butterfly flashiness crucially depends on wing scale curvature. [PDF]

Biol Lett
Sosa Espinosa J, Stavenga DG, van der Kooi CJ, Giraldo MA.   +3 more
europepmc   +1 more source

A Comprehensive Review of Optical Metrology and Perception Technologies. [PDF]

Sensors (Basel)
Shan S, Zhao F, Li Z, Luo L, Li X.
europepmc   +1 more source

Spin hall effect of light ellipsometry for nanoscale areal surface measurement. [PDF]

Sci Rep
Zahra N, Mizutani Y, Uenohara T, Takaya Y.   +3 more
europepmc   +1 more source

Dark-Field Scattering Imaging and Spectroscopy. [PDF]

ACS Appl Mater Interfaces
Li S, Chen Y, Fang Y, Zhuo X, Wang J.
europepmc   +1 more source