Results 111 to 120 of about 1,828 (206)

A General and Predictive Understanding of Thermal Transport from 1D- and 2D-Confined Nanostructures: Theory and Experiment. [PDF]

ACS Nano, 2021
Beardo A, Knobloch JL, Sendra L, Bafaluy J, Frazer TD, Chao W, Hernandez-Charpak JN, Kapteyn HC, Abad B, Murnane MM, Alvarez FX, Camacho J.   +11 more
europepmc   +1 more source

Remote Sensing of Ocean Wind Speed and Direction: An Introduction to Scatterometry

, 2004
This Webcast features Dr. Michael Freilich, Oregon State University, principal investigator on the QuikSCAT project for NSF, introducing and discussing the fundamentals of scatterometry and how they apply to the SeaWinds instrument on QuikSCAT.
Tim Spangler
core  

Investigating Structurally and Pigmentary Colored Featherworks via Noninvasive Methodologies. [PDF]

ACS Omega
Meier MC, de La Codre H, Kokkori M, Katsaggelos AK.   +3 more
europepmc   +1 more source

Feather iridescence of Coeligena hummingbird species varies due to differently organized barbs and barbules. [PDF]

Biol Lett, 2021
Giraldo M, Sosa J, Stavenga D.
europepmc   +1 more source

A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment. [PDF]

Sensors (Basel)
Joo K, Lee KH, Jeon JW.
europepmc   +1 more source

Scattered Light Imaging: Resolving the substructure of nerve fiber crossings in whole brain sections with micrometer resolution.

Neuroimage, 2021
Menzel M, Reuter JA, Gräßel D, Huwer M, Schlömer P, Amunts K, Axer M.   +6 more
europepmc   +1 more source

Information advantage in sensing revealed by Fano-resonant Fourier scatterometry. [PDF]

Nat Commun
Feldman N, den Boef AJ, Amitonova LV, Koenderink AF.   +3 more
europepmc   +1 more source

Coherent Fourier scatterometry reveals nerve fiber crossings in the brain. [PDF]

Biomed Opt Express, 2020
Menzel M, Pereira SF.
europepmc   +1 more source

Convolutional neural networks for mode on-demand high finesse optical resonator design. [PDF]

Sci Rep, 2023
Karpov DV, Kurdiumov S, Horak P.
europepmc   +1 more source

Atomic Force Microscopy (AFM)-Based Metrology for Advanced Etching in Three-Dimensional Integrated Circuits. [PDF]

Micromachines (Basel)
Chang J, Wang S, Liang S, Feng X, Zhao W.   +4 more
europepmc   +1 more source