The Static Limit in MeV Secondary Ion Mass Spectrometry. [PDF]
Sepahyar Lorentzen M +3 more
europepmc +1 more source
Secondary Ion Mass Spectrometry
openaire +2 more sources
Characterization of Chemical Degradation in Lithium-Ion Batteries Using Secondary Ion Mass Spectrometry (SIMS) and Hard X‑ray Photoelectron Spectroscopy (HAXPES). [PDF]
Alsaedi AH +4 more
europepmc +1 more source
Studies of Bis-(Sodium-Sulfopropyl)-Disulfide and 3-Mercapto-1-Propanesulfonate on/into the Copper Electrodeposited Layer by Time-of-Flight Secondary-Ion Mass Spectrometry. [PDF]
Mroczka R, Słodkowska A, Ładniak A.
europepmc +1 more source
Depth profiling of Cr-ITO dual-layer sample with secondary ion mass spectrometry using MeV ions in the low energy region. [PDF]
Barac M +6 more
europepmc +1 more source
Study on molecular orientation and stratification in RNA-lipid nanoparticles by cryogenic orbitrap secondary ion mass spectrometry. [PDF]
Kotowska AM +12 more
europepmc +1 more source
Revealing Contamination and Sequence of Overlapping Fingerprints by Unsupervised Treatment of a Hyperspectral Secondary Ion Mass Spectrometry Dataset. [PDF]
Tuccitto N +6 more
europepmc +1 more source
Multimodal Ion Beam Imaging to Correlate Elements and Metabolites at the Micron Scale Using Water Cluster Secondary Ion Mass Spectrometry and MeV Ion Beam Analysis. [PDF]
Costa C +7 more
europepmc +1 more source
Time-of-Flight Secondary Ion Mass Spectrometry Revealing the Organocatalyst Distribution in Functionalized Silica Monoliths. [PDF]
Brand RD +3 more
europepmc +1 more source

