Semiconductor manufacturing wastewater challenges and the potential solutions via printed electronics. [PDF]
Sandhu S +4 more
europepmc +1 more source
Exploring the Frontiers: Innovations in Semiconductor Technology and AI-Driven SoC Design
R Kiruthika +5 more
openalex +1 more source
In this paper, the first use of a siloxane‐substituted silicon phthalocyanine (iso(Si3O)2SiPc) in OTFTs is reported. Moreover, this compound displays the highest hole mobility (exceeding 1 cm2 V−1 s−1) ever recorded for SiPc, and the GIWAXS study reveals thin films with an exceptionally uniform crystalline texture.
Nicolas Ledos +5 more
wiley +1 more source
An Effective Hybrid Rescheduling Method for Wafer Chip Precision Packaging Workshops in Complex Manufacturing Environments. [PDF]
Wang Z, Fang W, Yang Y.
europepmc +1 more source
This review summarizes recent advances in closed‐cell in situ TEM strategies for accurate determination of the activity and stability of single‐atom catalyst systems during operation. Operando conditions causing dynamic changes of SAC systems are highlighted and we explain why ensemble average‐based optical techniques may benefit from the technological
Martin Ek +4 more
wiley +1 more source
Watt-Level, Narrow-Linewidth, Tunable Green Semiconductor Laser with External-Cavity Synchronous-Locking Technique. [PDF]
Feng C, Zeng B, Zou J, Ruan Q, Luo Z.
europepmc +1 more source
Probing entropy-facilitating superionic conduction in amorphous oxide semiconductors
Tariq Ahmad +12 more
openalex +1 more source
Thermal Phase‐Modulation of Thickness‐Dependent CVD‐Grown 2D In2Se3
A comprehensive study of CVD‐grown 2D In2Se3 reveals a distinct thickness‐dependent phase landscape and a reversible, thermally driven transformation between β″ and β* variants. In situ TEM electron diffraction and Raman spectroscopy reveal structural dynamics, while the structural invariance of the α‐phase in ultrathin regimes highlights its stability—
Dasun P. W. Guruge +6 more
wiley +1 more source
Comparison of Quantum Transition Characteristics of Group II-VI (ZnO), Group III-V (GaN) Compound Semiconductors, and Intrinsic (Si) Semiconductors in Response to Externally Applied Energy. [PDF]
Park H, Lee SH.
europepmc +1 more source

