Results 121 to 130 of about 86,995 (199)

In-Sensor-Memory Computing for Post-Von Neumann Intelligence: A Perspective. [PDF]

Nanomicro Lett
Tang H, Yu N, Min P, Guo R, Zhang G.
europepmc   +1 more source

Advances and Perspectives in Gate Dielectric Thin Films for 4H-SiC MOSFETs. [PDF]

Materials (Basel)
Bai Z, Liang J, Ding C, Zhou Z, Luo M, Gu L, Ma HP, Zhang QC.   +7 more
europepmc   +1 more source

Beyond the Silicon Plateau: A Convergence of Novel Materials for Transistor Evolution. [PDF]

Nanomicro Lett
Lee JH, Kim JY, Lee HJ, Choi SJ, Lee YJ, Jang HW.   +5 more
europepmc   +1 more source

Integrated Circuits on Fiber Substrates: State-of-the-Art System-on-Fiber Technologies for Smart Textiles and Wearables. [PDF]

Nanomicro Lett
Jin J, Won J, Kim D, Arumugasamy SK, Park S, Kim TW.   +5 more
europepmc   +1 more source

Enhanced Flexible Vacuum-Ultraviolet Photodetectors Based on Hexagonal Boron Nitride Nanosheets via Al Nanoparticles. [PDF]

Nanomaterials (Basel)
Chen Y, Li J, Li Q, Fang W, Liu H, Lin Z, Wang T, Yun F.   +7 more
europepmc   +1 more source

Origin of Threshold Voltage Instabilities in Indium Oxide Transistors. [PDF]

ACS Appl Mater Interfaces
Lin TJ, Chen SC, Lee YT, Cheng SL, Tseng R, Wang ST, Chang YC, Pan YY, Chang CY, Chou TT, Lin CH, Ku CS, Lin CL, Liu PT, Kim H, Lien DH.   +15 more
europepmc   +1 more source

Applicability Analysis of High-Voltage Transmission and Substation Equipment Based on Silicon Carbide Devices. [PDF]

Micromachines (Basel)
Zhang H, Nie M, Dong Q, Liu H, Jia P, Li Z, Fang Y.   +6 more
europepmc   +1 more source

Dipolar modulation of surface states in GaN via molecular ionization energy. [PDF]

Sci Rep
Chaulker OH, Turkulets Y, Shapira Y, Goldman RS, Shalish I.   +4 more
europepmc   +1 more source

High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress. [PDF]

Sensors (Basel)
Chao CY, Wu TM, Liu CC, Yeh SF, Lee CL, Tu H, Wu ZD, Huang JC, Chang CH.   +8 more
europepmc   +1 more source

Review of Prognosis Approaches Applied to Power SiC MOSFETs for Health State and Remaining Useful Life Prediction. [PDF]

Entropy (Basel)
Kumar S, Allard B, Hologne-Carpentier M, Clerc G, Auger F.   +4 more
europepmc   +1 more source