Charge transport models for reliability engineering of semiconductor devices
M. Bina
openalex +1 more source
Toughening β‐Ga2O3 via Mechanically Seeded Dislocations
β‐Ga2O3 is promising for next‐generation semiconductors but its brittleness limits flexible and high‐precision applications. Here, mechanically seeded dislocations introduced by surface deformation improved damage tolerance in (001) β‐Ga2O3. Nanoindentation and characterization show dislocations suppress cleavage cracks by enabling stable plastic ...
Zanlin Cheng +5 more
wiley +1 more source
Improve Intermetal Dielectric Process for HTRB Stability in Power GaN High Electron Mobility Transistor (HEMT) by unbiased-Highly Accelerated Stress Testing (uHAST). [PDF]
Chuang YT, Tumilty N, Wu TL.
europepmc +1 more source
The Effect of Purcell Cavities on the Lifetime of Thermally Activated Delayed Fluorescent Emitters
A pressing challenge to OLED displays and lighting is to balance high efficiency and long operational lifetime in the deep blue spectrum. The Purcell effect can reduce the triplet density and hence the probability for destructive energy‐driven triplet annihilation events that limit the OLED lifetime. Here we study of the Purcell effect on two different
Sritoma Paul +4 more
wiley +1 more source
Enabling scalable ferroelectric-based future generation vertical NAND flash with bonding-friendly architecture: strategies for erase and disturb optimization. [PDF]
Song I, Kim J, Lee S, Myeong I.
europepmc +1 more source
This study establishes a materials‐driven framework for entropy generation within standard CMOS technology. By electrically rebalancing gate‐oxide traps and Si‐channel defects in foundry‐fabricated FDSOI transistors, the work realizes in‐materia control of temporal correlation – achieving task adaptive entropy optimization for reinforcement learning ...
Been Kwak +14 more
wiley +1 more source
Stabilizing Stretchable Organic Transistors Through Small-Molecule Additive Blending for Ultra-Sensitive Pesticide Detection. [PDF]
Wang W +9 more
europepmc +1 more source
Reliability Express Control of the Gate Dielectric of Semiconductor Devices
В. А. Солодуха +4 more
openalex +2 more sources
Does a Morphotropic Phase Boundary Exist in ZrxHf1‐xO2‐Based Thin Films?
This study investigates 6 nm zirconium‐rich hafnium‐zirconium oxide thin–film metal–insulator–metal capacitors using a combination of experimental methods and machine learning–based molecular dynamics simulations to provide insight into the physical mechanisms that enhance the dielectric constant near 0 V and attribute it to the field‐induced ...
Pramoda Vishnumurthy +9 more
wiley +1 more source
Multi- and All-Acceptor Polymers for High-Performance n-Type Polymer Field Effect Transistors. [PDF]
Bharathi G, Hong S.
europepmc +1 more source

