Editor's Choice Articles in the Electronic Materials Section of <i>Materials</i> in 2025. [PDF]
Roccaforte F.
europepmc +1 more source
Nitrogen-Vacancy Centers in Fluorescent Nanodiamonds: Emerging Applications from Healthcare Diagnostics to Semiconductor Metrology. [PDF]
Chang HC.
europepmc +1 more source
Wafer Defect Recognition for Industrial Inspection: FCS-VMamba Model and Experimental Validation. [PDF]
Zhang Y +5 more
europepmc +1 more source
Prescribed-time prescribed-performance event-triggered control algorithm for wafer transfer robots. [PDF]
Xu B, Yu H, Yuan L, Huang S, Zhou J.
europepmc +1 more source
Deep reinforcement learning for scheduling semiconductor cluster tools in varying configurations. [PDF]
Choi J, Kim SB.
europepmc +1 more source
Multiple causal pathways of high-quality development for semiconductor enterprises in China. [PDF]
Li S, Yang X.
europepmc +1 more source
The Future of Semiconductor Manufacturing
openaire +1 more source
Related searches:
The pandemic crippled the global semiconductor market and, combined with spiralling demand, its impact is still being felt today, forcing major Western economies to bring production closer to home. Here we look at the role of pumps in this seismic shift of manufacturing facilities.
openaire +1 more source
E-manufacturing in the semiconductor industry
IEEE Robotics &amp;amp; Automation Magazine, 2006This paper presents a case study on how e-manufacturing is applied to enable preventive maintenance (PM) spacing. The PM schedules are generated by a mixed-integer programming-based optimizer, and the tool selection algorithm is applied for automated realtime dispatching. The fab automation systems visually display the solver results to technicians and
Peter H. Tag, Mike Tao Zhang
openaire +1 more source
Semiconductor manufacturing process visualization
SMC'03 Conference Proceedings. 2003 IEEE International Conference on Systems, Man and Cybernetics. Conference Theme - System Security and Assurance (Cat. No.03CH37483), 2004This paper describes a new graphical display of semiconductor manufacturing processes. The display shows the tool usage at each step and the frequency of transitions between adjacent steps using a normalized nonlinear color map. We use normalized entropy and conditional entropy to quantify how close the tool usage and transition frequencies are to an ...
James McNames +3 more
openaire +1 more source

