Results 141 to 150 of about 211,225 (152)

Dependence of inverter chain single-event cross sections on inverter spacing in 65 nm bulk CMOS technology

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2016
Single-event cross sections of four inverter chains, with uniform inverter spacing ranging from 120 nm to 4 μm, were experimentally measured and compared. These inverter chains were irradiated using a focused ion beam. Waveforms of responses were sensed using on-chip wide-bandwidth analog multiplexers.
Mladen Mitrovic, Michael Hofbauer, Bernhard Goll, Kerstin Schneider-Hornstein, Robert Swoboda, Bernhard Steindl, Kay-Obbe Voss, Horst Zimmermann   +7 more
openaire   +1 more source

Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters

2014
We show how experimental SEU cross section can be used to characterize a device. We extract parameters that can be used for SEU cross section calculation for any other kind of particle.
Wrobel, Frédéric, Touboul, Antoine, Pouget, Vincent, Dilillo, Luigi, Saigné, Frédéric   +4 more
openaire   +1 more source

Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model

IEEE Transactions on Nuclear Science, 1996
Whereas HIC-UP modeled the heavy ion strike as a line source of charge, HIC-UP-TS accounts for the spatial distribution of electron-hole-pairs by using a 1/r/sup 2/ profile. The model compares well with experimental data.
L.W. Connell, F.W. Sexton, P.J. McDaniel, A.K. Prinja   +3 more
openaire   +1 more source

Voltage Dependence of Single-Event Cross Sections of FinFET SRAMs for Low LET Condition

IEEE Transactions on Nuclear Science, 2023
K. Takeuchi, K. Sakamoto, K. Yukumatsu, T. Kato, H. Matsuyama, A. Takeyama, T. Makino, T. Ohshima, H. Shindo   +8 more
openaire   +1 more source

Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

High Power Laser and Particle Beams, 2011
姚志斌 Yao Zhibin, 范如玉 Fan Ruyu, 郭红霞 Guo Hongxia, 王忠明 Wang Zhongming, 何宝平 He Baoping, 张凤祁 Zhang Fengqi, 张科营 Zhang Keying   +6 more
openaire   +1 more source

Single event transient study on PMOS-NMOS cross-coupled LC-VCO using PLL

International Journal of Electronics, 2021
exaly  

Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells

IEEE Transactions on Nuclear Science, 2016
Maxim Gorbunov
exaly  

A Phenomenological Cross Section Approach to Single Event Rate Characterization: Experimental Averaging over Full Solid Angle

2022
Mrozovskaya, Elizaveta V, Galimov, Artur M, Chubunov, Pavel A, Zebrev, Gennady I   +3 more
openaire   +1 more source

Issues for single-event proton testing of SRAMs

IEEE Transactions on Nuclear Science, 2004
Philippe Paillet, G L Hash, J R Schwank   +2 more
exaly  

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

IEEE Transactions on Nuclear Science, 2005
R A Reed, R A Weller, J S Melinger
exaly