Results 1 to 10 of about 853,970 (265)

Study on Single Event Effect Simulation in T-Shaped Gate Tunneling Field-Effect Transistors [PDF]

open access: yesMicromachines, 2021
Tunneling field-effect transistors (TFETS) can reduce the subthreshold swing (SS) to below 60 mV/decade due to their conduction mechanism with band-to-band tunneling (BTBT), thereby reducing power consumption.
Chen Chong   +4 more
doaj   +2 more sources

Experimental Comparison of the Single-Event Effects of Single-Photon and Two-Photon Absorption under a Pulsed Laser

open access: yesApplied Sciences, 2022
The pulsed laser has gradually become the standard method of studying the single-event effects of micro-nano devices, and it is a powerful supplement to heavy ion experiments on single-event effects.
Heng An   +6 more
doaj   +3 more sources

Evaluation of Single-Event Effect Current-Carrier Mapping Based on Experimental Data [PDF]

open access: yesMicromachines
For single-event radiation damage of power MOSFET devices, this paper aims to establish a statistical analysis method based on external observation (gate/drain current characteristics in irradiation environment) to recognize and evaluate the radiation ...
Mengtian Bao   +3 more
doaj   +2 more sources

Research on Single-Event Effect Hardening Method of Transverse Split-Gate Trench Metal-Oxide-Semiconductor Field-Effect Transistors [PDF]

open access: yesMicromachines
In this work, the single-event burnout (SEB) effect and degradation behaviors induced by heavy-ion irradiation are investigated in a 120 V-rated transverse split-gate trench (TSGT) power metal-oxide-semiconductor field-effect transistor (MOSFET). Bismuth
Mengtian Bao   +3 more
doaj   +2 more sources

Bootstrapped Driver and the Single-Event-Upset Effect [PDF]

open access: yesIEEE Transactions on Circuits and Systems I: Regular Papers, 2020
As VLSI circuits are progressing in very Deep Submicron (DSM) regime without decreasing chip area, the importance of global interconnects increases but at the cost of performance and power consumption. This work proposes a low power circuit for driving a global interconnect at voltages close to the noise level. In order to address ultra-low power (ULP)
Mohammed Al-daloo   +3 more
openaire   +2 more sources

Single Event Effect Analysis of SiGe Low Noise Amplifier

open access: yesElectronics, 2021
This paper analyzes the single event transient (SET) response of low noise amplifier (LNA) designed using SiGe heterojunction bipolar transistors (HBT).
Manel Bouhouche, Saida Latreche
doaj   +1 more source

Simulation study of beam distribution and secondary neutron for intermediate energy proton single event effect test

open access: yesHe jishu, 2021
BackgroundBased on the 100 MeV proton cyclotron in the China Institute of Atomic Energy (CIAE), the middle-energy proton irradiation test facility was established and several proton single event effect (SEE) experimental study of micro-and nano ...
CHEN Qiming   +6 more
doaj   +1 more source

Design an Experiment to Identify Characteristic X-ray Spectrum Emitted by Xe Ion in Fast Mixed Heavy Ions

open access: yesYuanzineng kexue jishu, 2023
There are a lot of particles in space, including protons and heavy ions mainly. These particles in space can induce different radiation effects on the electronic devices, such as single event effect and displacement damage. The single event effect is the
ZHAO Shuyong1,2;GUO Gang1,2,*;SUI Li1,2;ZHANG Zheng1,2;CHEN Qiming1,2;LIU Jiancheng1,2;ZHANG Shufeng1
doaj   +1 more source

Recent research progress of single particle effect of SiC MOSFET

open access: yesHe jishu, 2022
With the rapid development of nuclear energy and space technology, application of high-voltage power devices based on SiC, especially the SiC MOSFET, is increasing. The problems of single event effect (SEE) caused by high-energy particle radiation in the
LIU Cuicui   +6 more
doaj   +1 more source

Effect of Temperature on Single Event Latchup Sensitivity [PDF]

open access: yes2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020
Single-Event Latchup (SEL) concerns CMOS technology as a major reliability issue and it is influenced by different parameters. In this work, the effect of the temperature variation on SEL has been investigated and its effect has been analyzed combining the variation of three parameters related to the geometry and to the design of the component: doping ...
S. Guagliardo   +7 more
openaire   +1 more source

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