Results 1 to 10 of about 852,793 (216)

Evaluation of Atmospheric Neutron Failure Rates and Damage Mechanisms of Ultra-high Voltage Thyristor for DC Transmission

Yuanzineng kexue jishu
As the core of high-voltage direct-current transmission technology, the DC converter valve and its key power device thyristor face a high risk of failure caused by atmospheric neutron when operating in high-altitude areas. The atmospheric neutron failure
PENG Chao1, ZHOU Yang2, CHEN Zhongyuan2, LEI Zhifeng1, MA Teng1, ZHANG Zhangang1, ZHANG Hong1, HE Yujuan1
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Simulation of Single Particle Effect of CCD Image Sensor at Different Sensitive Moments

Yuanzineng kexue jishu
Charge coupled device (CCD) image sensors, as crucial photoelectric imaging devices, are widely employed in fields such as astronomical observations, medical imaging, aerospace, and industrial inspections.
LI Chuanzhou1, WANG Zujun1, 2, , JIANG Rongyu1, YANG Xin1, YIN Liyuan3
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Simulation of Single-Event Transient Effect for GaN High-Electron-Mobility Transistor

Micromachines, 2023
A GaN high-electron-mobility transistor (HEMT) was simulated using the semiconductor simulation software Silvaco TCAD in this paper. By constructing a two-dimensional structure of GaN HEMT, combined with key models such as carrier mobility, the effects ...
Zhiheng Wang, Yanrong Cao, Xinxiang Zhang, Chuan Chen, Linshan Wu, Maodan Ma, Hanghang Lv, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma, Yue Hao   +11 more
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A platform design of single event effect mitigation for SRAM-based FPGA

Dianzi Jishu Yingyong, 2019
Be aimed at application requirements of VLSI(very large scale integration) in space environment, current researching status in China and abroad of radiation harden of FPGA are introduced in the paper.
Qi Liuyu, Liu Guodong, Zhao Zhengyang
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Simulation of 50-500 MeV Quasi-monoenergetic Neutron Source for Single Event Effect Irradiation Experiment

Yuanzineng kexue jishu, 2023
The neutron-induced single event effect affects the reliability of electronic devices used in aircraft and ground nuclear facilities. With the progress of semiconductor technology, device feature sizes become smaller and more integrated, radiation ...
CHEN Qiming;GUO Gang;HAN Jinhua;ZHAO Shuyong;MA Xu;ZHANG Zheng;LIU Jiancheng
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Evaluation of Single Event Effect on RK3588 Neural Processing Unit Using Spallation Neutron Irradiation and Software Fault Injection

Applied System Innovation
This research investigates atmospheric neutron-induced single event effects (SEEs) on advanced artificial intelligence (AI) chips during natural environment operation.
Weitao Yang, Wuqing Song, Huan He, Zhiliang Hu, Yonghong Li   +4 more
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Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research

Applied Sciences, 2020
Research on single event effects (SEEs) is significant to the design and manufacture of modern electronic devices. By applying two photon absorption (TPA) ultra-fast pulsed lasers, extra electron-hole pairs (EHPs) are generated in a desired location on a
Cheng Gu, George Belev, Haonan Tian, Shuting Shi, Issam Nofal, Shijie Wen, Li Chen   +6 more
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Experimental Study on Real-time Measurement of Atmospheric-neutron Induced Single Event Effect Based on High-altitude Area

Yuanzineng kexue jishu, 2022
Based on the test site at the Qinghai Tibet Plateau with an altitude of 4 300 m, atmospheric neutron single event effects of a 65 nm high speed large area static random access memory (SRAM) array were measured in real time.
ZHANG Zhangang;LEI Zhifeng;HUANG Yun;EN Yunfei;ZHANG Yi;TONG Teng;LI Xiaohui;SHI Qian;PENG Chao;HE Yujuan;XIAO Qingzhong;LI Jianke;LU Guoguang
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Single event effects in carbon nanotube electronics

Nano Research
Recent studies on carbon nanotube (CNT) field-effect transistors (FETs) and integrated circuits (ICs) have shown their potential in radiation tolerance.
Ruhai Liu, Yifu Sun, Rui Chen, Lingyu Zhang, Qian Chen, Can Yang, Huiping Zhu, Peng Lu, Zhiyong Zhang, Maguang Zhu   +9 more
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A Single Event Effect Mitigation Strategy for Nanointegrated Circuit Reinforced Latches

IEEE Access
With the widespread application of nano integrated circuits in high radiation environments such as aerospace and military, single event effects have become the main factor affecting their stability and reliability.
Yizhu Wang
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