Results 11 to 20 of about 17,695,032 (262)
Single-Event Effects in CMOS Image Sensors [PDF]
IEEE Transactions on Nuclear Science, 2013 In this paper, 3T active pixel sensors (APS) are exposed to heavy ions (N, Ar, Kr, Xe), and single-event effects (SEE) are studied. Devices were fully functional during exposure, no single-event latch-up (SEL) or single-event functional interrupt (SEFI) happened.
Lalucaa, Valerian +4 more
openaire +6 more sources
He jishu, 2023 BackgroundThe space environment contains numerous high-energy particles, and a single high-energy particle passing through a spacecraft shell bombards the electronic devices within, triggering single-particle effects such as device logic state upset and ...
CHEN Qiming +9 more
doaj +2 more sources
Yuanzineng kexue jishu, 2023 The neutron-induced single event effect affects the reliability of electronic devices used in aircraft and ground nuclear facilities. With the progress of semiconductor technology, device feature sizes become smaller and more integrated, radiation ...
CHEN Qiming;GUO Gang;HAN Jinhua;ZHAO Shuyong;MA Xu;ZHANG Zheng;LIU Jiancheng
doaj +2 more sources
A post-pandemic reflection of the changing role of contemporary event professionals: Implications for event professionals and higher education [PDF]
, 2023 While the event, tourism, and hospitality industry is constantly evolving, COVID-19 vastly shifted the roles, responsibilities, and jobs for event professionals, which caused event management educators to reevaluate their curriculum and course offerings.
Savannah Kay Kramer +7 more
core +1 more source
The effect of event repetition on the production of story-grammar in children’s event narratives [PDF]
, 2011 Objective: This study examined the effect of event repetition on the amount and nature of story grammar produced by children when recalling the event.
Kim P. Roberts +8 more
core +1 more source
Single-Event Upset Analysis and Protection in High Speed Circuits [PDF]
, 2006 The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at
Lofti-Kamran, P. +13 more
core +1 more source
Single-event effect responses of integrated panar inductors in 65 nm CMOS
, 2021 This article describes a previously unreported single-event radiation effect in spiral inductors manufactured in a commercial CMOS technology when subjected to ionizing radiation.
Kölpin, Alexander +5 more
core +1 more source
Metu-Defocusing Beamline : A 15-30 Mev Proton Irradiation Facility and Beam Measurement System [PDF]
EPJ Web of Conferences, 2020 Middle East Technical University – Defocusing Beam Line (METU-DBL) project is an irradiation facility providing 15 MeV to 30 MeV kinetic energy protons for testing various high radiation level applications, ranging from Hi-Lumi LHC upgrade, space ...
Bilge Demirkoz M. +15 more
doaj +1 more source
The methodology for active testing of electronic devices under the radiations [PDF]
Nuclear Technology and Radiation Protection, 2018 The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized.
Parlato Aldo +3 more
doaj +1 more source
A Novel Configurable SOI Technology with Extremely High Radiation Tolerance
Yuanzineng kexue jishu, 2023 Deep space exploration, nuclear industry and high energy physics raise higher requirements for the radiation hardness of integrated circuits. However, the existing radiation hardening technologies, such as radiation hardness by design based on bulk ...
YE Tianchun1,2,*;LI Bo1,2,3;LIU Fanyu1,2,3;LI Duoli1,2,3;LI Binhong1,2,3;CHEN Siyuan1,3
doaj +1 more source