Results 21 to 30 of about 852,793 (216)
A Soft-Error-Tolerant SAR ADC with Dual-Capacitor Sample-and-Hold Control for Sensor Systems
Sensors, 2021 For a reliable and stable sensor system, it is essential to precisely measure various sensor signals, such as electromagnetic field, pressure, and temperature.
Duckhoon Ro, Minseong Um, Hyung-Min Lee
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He jishu, 2023 BackgroundThe space environment contains numerous high-energy particles, and a single high-energy particle passing through a spacecraft shell bombards the electronic devices within, triggering single-particle effects such as device logic state upset and ...
CHEN Qiming +9 more
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Metu-Defocusing Beamline : A 15-30 Mev Proton Irradiation Facility and Beam Measurement System [PDF]
EPJ Web of Conferences, 2020 Middle East Technical University – Defocusing Beam Line (METU-DBL) project is an irradiation facility providing 15 MeV to 30 MeV kinetic energy protons for testing various high radiation level applications, ranging from Hi-Lumi LHC upgrade, space ...
Bilge Demirkoz M. +15 more
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Impact of JFET Region Width on Single Event Effects of SiC MOSFETs
Yuanzineng kexue jishu, 2023 The advantages of SiC MOSFETs (metal-oxide semiconductor field effect transistor) make this technology attractive for space, avionics and high-energy accelerator applications.
XU Mingkang1;JIA Yunpeng1,*;ZHOU Xintian1;HU Dongqing1;WU Yu1;TANG Yun1;LI Rongjia1;ZHAO Yuanfu1,2;WANG Liang2
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The methodology for active testing of electronic devices under the radiations [PDF]
Nuclear Technology and Radiation Protection, 2018 The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized.
Parlato Aldo +3 more
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Lineal Energy of Proton in Silicon by a Microdosimetry Simulation
Applied Sciences, 2021 Single event upset, or Single Event Effect (SEE) is increasingly important as semiconductor devices are entering into nano-meter scale. The Linear Energy Transfer (LET) concept is commonly used to estimate the rate of SEE.
Yueh Chiang +4 more
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A Novel Configurable SOI Technology with Extremely High Radiation Tolerance
Yuanzineng kexue jishu, 2023 Deep space exploration, nuclear industry and high energy physics raise higher requirements for the radiation hardness of integrated circuits. However, the existing radiation hardening technologies, such as radiation hardness by design based on bulk ...
YE Tianchun1,2,*;LI Bo1,2,3;LIU Fanyu1,2,3;LI Duoli1,2,3;LI Binhong1,2,3;CHEN Siyuan1,3
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The Analysis on Space Radiation Environment and Effect of the KOMPSAT-2 Spacecraft(II): Single Event Effect [PDF]
Journal of Astronomy and Space Sciences, 2001 In this paper, space radiation environment and single event effect(SEE) have been analyzed for the KOMPSAT-2 operational orbit. As spacecraft external and internal space environment, trapped proton, SEP(solar energetic particle) and GCR(galactic cosmic ...
Myung-Jin Baek +2 more
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System-on-chip single event effect hardening design and validation using proton irradiation
Nuclear Engineering and Technology, 2023 A multi-layer design is applied to mitigate single event effect (SEE) in a 28 nm System-on-Chip (SoC). It depends on asymmetric multiprocessing (AMP), redundancy and system watchdog.
Weitao Yang +4 more
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Single-event effect testing of the PNI RM3100 magnetometer for space applications [PDF]
Geoscientific Instrumentation, Methods and Data Systems, 2022 The results of a destructive single-event effect susceptibility radiation test of the PNI RM3100 magnetometer sensor, specifically the MagI2C ASIC (application-specific integrated circuit) on the sensor board are presented.
M. B. Moldwin +3 more
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