Results 51 to 60 of about 211,225 (152)

Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset

IEEE Transactions on Nuclear Science
This paper proposes a method for predicting the cross section (XS) of single event upset (SEU) induced by proton direct ionization (PDI). The method is based on the physics-based model previously proposed for both bulk FinFET static random access memories (SRAMs) and planar SRAMs under heavy ion irradiation.
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo   +9 more
openaire   +2 more sources

Data Feature Analysis of Non-Scanning Multi Target Millimeter-Wave Radar in Traffic Flow Detection Applications

Sensors, 2018
The millimeter-wave radar has been widely used in traffic applications. However, little research has been done to install the millimeter-wave radar on the top of a road for detecting road traffic flow at a downward looking direction.
Haiqing Liu, Na Li, Deyong Guan, Laxmisha Rai   +3 more
doaj   +1 more source

Multiple-Cell Upset Mechanisms in a Submicron SRAM

IEEE Access
On-orbit systems operate in harsh radiation environments; as a consequence, radiation induced single-event upsets (SEUs) may interrupt the scheduled operations of microelectronics.
Stefania Esquer, Jesse K. Mee, Heather M. Quinn, Ronald D. Schrimpf, Brian D. Sierawski   +4 more
doaj   +1 more source

Single-event effects: experimental setup for power MOSFETs and diffusion model for cross section calculations in low-voltage MOSFETs

Journal of Physics: Conference Series, 2019
Abstract MOSFETs are subject to different types of Single-Event Effects (SEEs) induced by heavy ions, with low-voltage MOSFETs being more susceptible to non-destructive effects, such as Single-Event Transients, than high-voltage MOSFETs which may also be susceptible to destructive effects.
S G Alberton, N H Medina, N Added, V A P Aguiar, R Menegasso, E L A Macchione, M A G Silveira   +6 more
openaire   +1 more source

Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET

Nuclear Engineering and Technology
--With the rapid advancement of artificial intelligence (AI) chips in diverse applications, single event effects (SEE) caused by high energy particles in ambient environment have emerged as a critical concern.
Yonghong Li, Jianan Tong, Weitao Yang, Zhiliang Hu, Lihua Mo, Tianjiao Liang, Chaohui He, Jinghui Lan   +7 more
doaj   +1 more source

Retrieving 3D Wind Field from Phased Array Radar Rapid Scans

Advances in Meteorology, 2013
The previous two-dimensional simple adjoint method for retrieving horizontal wind field from a time sequence of single-Doppler scans of reflectivity and/or radial velocity is further developed into a new method to retrieve both horizontal and vertical ...
Xiaobin Qiu, Qin Xu, Chongjian Qiu, Kang Nai, Pengfei Zhang   +4 more
doaj   +1 more source

SEU-Hardened High-Speed SRAM Design with Self-Refresh and Adjacent-Bit Error Correction

Micromachines
This paper proposes a high-speed static random access memory (SRAM) architecture that integrates a self-refresh mechanism with a novel single error and adjacent-bit errors correction (SEABEC) scheme to enhance resilience against single-event upsets (SEUs)
Tianwen Li, Jianbing Tian, Jingli Qi
doaj   +1 more source

SEU Rate and Reliability Analysis in LEO Satellites [PDF]

فصلنامه علوم و فناوری فضایی, 2012
Due to high design and launch cost of satellites, their failure probability should be minimized. Single Event Effects (SEUs) are one of the most common error sources in satellite microelectronic. To cope with these unwanted errors, various techniques are
Reza Omidi Gosheblagh, Karim Mohammadi
doaj  

Measurement of the 1-jettiness event shape observable in deep-inelastic electron-proton scattering at HERA

European Physical Journal C: Particles and Fields
The H1 Collaboration reports the first measurement of the 1-jettiness event shape observable $$\tau _1^b$$ τ 1 b in neutral-current deep-inelastic electron-proton scattering (DIS).
H1 Collaboration, V. Andreev, M. Arratia, A. Baghdasaryan, A. Baty, K. Begzsuren, A. Bolz, V. Boudry, G. Brandt, D. Britzger, A. Buniatyan, L. Bystritskaya, A. J. Campbell, K. B. Cantun Avila, K. Cerny, V. Chekelian, Z. Chen, J. G. Contreras, J. Cvach, J. B. Dainton, K. Daum, A. Deshpande, C. Diaconu, A. Drees, G. Eckerlin, S. Egli, E. Elsen, L. Favart, A. Fedotov, J. Feltesse, M. Fleischer, A. Fomenko, C. Gal, J. Gayler, L. Goerlich, N. Gogitidze, M. Gouzevitch, C. Grab, T. Greenshaw, G. Grindhammer, D. Haidt, R. C. W. Henderson, J. Hessler, J. Hladký, D. Hoffmann, R. Horisberger, T. Hreus, F. Huber, P. M. Jacobs, M. Jacquet, T. Janssen, A. W. Jung, J. Katzy, C. Kiesling, M. Klein, C. Kleinwort, H. T. Klest, S. Kluth, R. Kogler, P. Kostka, J. Kretzschmar, D. Krücker, K. Krüger, M. P. J. Landon, W. Lange, P. Laycock, S. H. Lee, S. Levonian, W. Li, J. Lin, K. Lipka, B. List, J. List, B. Lobodzinski, O. R. Long, E. Malinovski, H.-U. Martyn, S. J. Maxfield, A. Mehta, A. B. Meyer, J. Meyer, S. Mikocki, V. M. Mikuni, M. M. Mondal, K. Müller, B. Nachman, Th. Naumann, P. R. Newman, C. Niebuhr, G. Nowak, J. E. Olsson, D. Ozerov, S. Park, C. Pascaud, G. D. Patel, E. Perez, A. Petrukhin, I. Picuric, D. Pitzl, R. Polifka, S. Preins, V. Radescu, N. Raicevic, T. Ravdandorj, D. Reichelt, P. Reimer, E. Rizvi, P. Robmann, R. Roosen, A. Rostovtsev, M. Rotaru, D. P. C. Sankey, M. Sauter, E. Sauvan, S. Schmitt, B. A. Schmookler, G. Schnell, L. Schoeffel, A. Schöning, S. Schumann, F. Sefkow, S. Shushkevich, Y. Soloviev, P. Sopicki, D. South, A. Specka, M. Steder, B. Stella, L. Stöcker, U. Straumann, C. Sun, T. Sykora, P. D. Thompson, F. Torales Acosta, D. Traynor, B. Tseepeldorj, Z. Tu, G. Tustin, A. Valkárová, C. Vallée, P. van Mechelen, D. Wegener, E. Wünsch, J. Žáček, J. Zhang, Z. Zhang, R. Žlebčík, H. Zohrabyan, F. Zomer   +148 more
doaj   +1 more source

Polarised cross sections for vector boson production with Sherpa

Journal of High Energy Physics
Measurements of vector boson polarisation in vector boson production processes offer a powerful probe of the electroweak symmetry breaking mechanism, scrutinising the Standard Model and new physics scenarios alike. Since massive vector bosons can only be
Mareen Hoppe, Marek Schönherr, Frank Siegert   +2 more
doaj   +1 more source